{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,7,16]],"date-time":"2024-07-16T05:40:24Z","timestamp":1721108424654},"reference-count":29,"publisher":"MDPI AG","issue":"15","license":[{"start":{"date-parts":[[2021,7,28]],"date-time":"2021-07-28T00:00:00Z","timestamp":1627430400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100000266","name":"Engineering and Physical Sciences Research Council","doi-asserted-by":"publisher","award":["EP\/M020746\/1","EP\/L01498X\/1"],"id":[{"id":"10.13039\/501100000266","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"In-situ metrology utilised for surface topography, texture and form analysis along with quality control processes requires a high-level of reliability. Hence, a traceable method for calibrating the measurement system\u2019s transfer function is required at regular intervals. This paper compares three methods of dimensional calibration for a spectral domain low coherence interferometer using a reference laser interferometer versus two types of single material measure. Additionally, the impact of dataset sparsity is shown along with the effect of using a singular calibration dataset for system performance when operating across different media.<\/jats:p>","DOI":"10.3390\/s21155101","type":"journal-article","created":{"date-parts":[[2021,7,29]],"date-time":"2021-07-29T01:21:04Z","timestamp":1627521664000},"page":"5101","source":"Crossref","is-referenced-by-count":3,"title":["Pragmatic Micrometre to Millimetre Calibration Using Multiple Methods for Low-Coherence Interferometer in Embedded Metrology Applications"],"prefix":"10.3390","volume":"21","author":[{"given":"Tom","family":"Hovell","sequence":"first","affiliation":[{"name":"Wolfson School of Mechanical, Electrical and Manufacturing Engineering, Loughborough University, Loughborough LE11 3TU, UK"}]},{"ORCID":"http:\/\/orcid.org\/0000-0001-5765-5188","authenticated-orcid":false,"given":"Jon","family":"Petzing","sequence":"additional","affiliation":[{"name":"Wolfson School of Mechanical, Electrical and Manufacturing Engineering, Loughborough University, Loughborough LE11 3TU, UK"}]},{"given":"Laura","family":"Justham","sequence":"additional","affiliation":[{"name":"Wolfson School of Mechanical, Electrical and Manufacturing Engineering, Loughborough University, Loughborough LE11 3TU, UK"}]},{"ORCID":"http:\/\/orcid.org\/0000-0001-9165-2466","authenticated-orcid":false,"given":"Peter","family":"Kinnell","sequence":"additional","affiliation":[{"name":"Wolfson School of Mechanical, Electrical and Manufacturing Engineering, Loughborough University, Loughborough LE11 3TU, UK"}]}],"member":"1968","published-online":{"date-parts":[[2021,7,28]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"843","DOI":"10.1016\/j.cirp.2019.05.005","article-title":"On-machine and in-process surface metrology for precision manufacturing","volume":"68","author":"Gao","year":"2019","journal-title":"CIRP Ann."},{"key":"ref_2","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1117\/1.OE.59.1.014113","article-title":"Lensless fiber-deployed low-coherence interferometer for in-situ measurements in nonideal environments","volume":"59","author":"Hovell","year":"2020","journal-title":"Opt. 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