{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,30]],"date-time":"2025-04-30T02:30:24Z","timestamp":1745980224597,"version":"3.37.3"},"reference-count":35,"publisher":"MDPI AG","issue":"10","license":[{"start":{"date-parts":[[2020,5,12]],"date-time":"2020-05-12T00:00:00Z","timestamp":1589241600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100000271","name":"Science and Technology Facilities Council","doi-asserted-by":"publisher","award":["Centre for Instrumentation: FEEDER Managed Programme"],"id":[{"id":"10.13039\/501100000271","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"Since the late 2000s, the availability of high-quality cadmium zinc telluride (CdZnTe) has greatly increased. The excellent spectroscopic performance of this material has enabled the development of detectors with volumes exceeding 1 cm3 for use in the detection of nuclear materials. CdZnTe is also of great interest to the photon science community for applications in X-ray imaging cameras at synchrotron light sources and free electron lasers. Historically, spatial variations in the crystal properties and temporal instabilities under high-intensity irradiation has limited the use of CdZnTe detectors in these applications. Recently, Redlen Technologies have developed high-flux-capable CdZnTe material (HF-CdZnTe), which promises improved spatial and temporal stability. In this paper, the results of the characterization of 10 HF-CdZnTe detectors with dimensions of 20.35 mm \u00d7 20.45 mm \u00d7 2.00 mm are presented. Each sensor has 80 \u00d7 80 pixels on a 250-\u03bcm pitch and were flip-chip-bonded to the STFC HEXITEC ASIC. These devices show excellent spectroscopic performance at room temperature, with an average Full Width at Half Maximum (FWHM) of 0.83 keV measured at 59.54 keV. The effect of tellurium inclusions in these devices was found to be negligible; however, some detectors did show significant concentrations of scratches and dislocation walls. An investigation of the detector stability over 12 h of continuous operation showed negligible changes in performance.<\/jats:p>","DOI":"10.3390\/s20102747","type":"journal-article","created":{"date-parts":[[2020,5,12]],"date-time":"2020-05-12T14:53:55Z","timestamp":1589295235000},"page":"2747","source":"Crossref","is-referenced-by-count":47,"title":["Characterization of the Uniformity of High-Flux CdZnTe Material"],"prefix":"10.3390","volume":"20","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5457-4884","authenticated-orcid":false,"given":"Matthew Charles","family":"Veale","sequence":"first","affiliation":[{"name":"Rutherford Appleton Laboratory, UKRI Science & Technology Facilities Council, Oxon OX11 0QX, UK"}]},{"given":"Paul","family":"Booker","sequence":"additional","affiliation":[{"name":"Rutherford Appleton Laboratory, UKRI Science & Technology Facilities Council, Oxon OX11 0QX, UK"}]},{"given":"Simon","family":"Cross","sequence":"additional","affiliation":[{"name":"Rutherford Appleton Laboratory, UKRI Science & Technology Facilities Council, Oxon OX11 0QX, UK"}]},{"given":"Matthew David","family":"Hart","sequence":"additional","affiliation":[{"name":"Rutherford Appleton Laboratory, UKRI Science & Technology Facilities Council, Oxon OX11 0QX, UK"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3230-598X","authenticated-orcid":false,"given":"Lydia","family":"Jowitt","sequence":"additional","affiliation":[{"name":"Rutherford Appleton Laboratory, UKRI Science & Technology Facilities Council, Oxon OX11 0QX, UK"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1193-8745","authenticated-orcid":false,"given":"John","family":"Lipp","sequence":"additional","affiliation":[{"name":"Rutherford Appleton Laboratory, UKRI Science & Technology Facilities Council, Oxon OX11 0QX, UK"}]},{"given":"Andreas","family":"Schneider","sequence":"additional","affiliation":[{"name":"Rutherford Appleton Laboratory, UKRI Science & Technology Facilities Council, Oxon OX11 0QX, UK"}]},{"given":"Paul","family":"Seller","sequence":"additional","affiliation":[{"name":"Rutherford Appleton Laboratory, UKRI Science & Technology Facilities Council, Oxon OX11 0QX, UK"}]},{"given":"Rhian Mair","family":"Wheater","sequence":"additional","affiliation":[{"name":"Rutherford Appleton Laboratory, UKRI Science & Technology Facilities Council, Oxon OX11 0QX, UK"}]},{"given":"Matthew David","family":"Wilson","sequence":"additional","affiliation":[{"name":"Rutherford Appleton Laboratory, UKRI Science & Technology Facilities Council, Oxon OX11 0QX, UK"}]},{"given":"Conny Christoffer Tobias","family":"Hansson","sequence":"additional","affiliation":[{"name":"Redlen Technologies, Saanichton, BC V8M 1X6, Canada"}]},{"given":"Krzysztof","family":"Iniewski","sequence":"additional","affiliation":[{"name":"Redlen Technologies, Saanichton, BC V8M 1X6, Canada"}]},{"given":"Pramodha","family":"Marthandam","sequence":"additional","affiliation":[{"name":"Redlen Technologies, Saanichton, BC V8M 1X6, Canada"}]},{"given":"Georgios","family":"Prekas","sequence":"additional","affiliation":[{"name":"Redlen Technologies, Saanichton, BC V8M 1X6, Canada"}]}],"member":"1968","published-online":{"date-parts":[[2020,5,12]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"103","DOI":"10.1016\/S0927-796X(01)00027-4","article-title":"Cadmium zinc telluride and its use as a nuclear radiation detector material","volume":"32","author":"Schlesinger","year":"2001","journal-title":"Mat. Sci. Eng. Rep."},{"key":"ref_2","doi-asserted-by":"crossref","first-page":"082101","DOI":"10.1063\/1.2883924","article-title":"A mechanism for dynamic lateral polarization in CdZnTe under high flux x-ray irradiation","volume":"92","author":"Bale","year":"2008","journal-title":"Appl. Phys. Lett."},{"key":"ref_3","doi-asserted-by":"crossref","first-page":"2649","DOI":"10.1109\/TNS.2016.2593631","article-title":"Special Nuclear Material Characterization Using Digital 3-D Position Sensitive CdZnTe Detectors and High Purity Germanium Spectrometers","volume":"63","author":"Streicher","year":"2016","journal-title":"Tran. Nucl. Sci."},{"key":"ref_4","first-page":"C12034","article-title":"CZT sensors for Computed Tomography: From crystal growth to image quality","volume":"11","author":"Iniewski","year":"2016","journal-title":"J. Inst."},{"key":"ref_5","first-page":"C12045","article-title":"Characterisation of Redlen high-flux CdZnTe","volume":"12","author":"Thomas","year":"2017","journal-title":"J. Inst."},{"key":"ref_6","first-page":"085106","article-title":"Cadmium zinc telluride pixel detectors for high-intensity x-ray imaging at free electron lasers","volume":"12","author":"Veale","year":"2018","journal-title":"J. Phys. D Appl. Phys."},{"key":"ref_7","first-page":"C04009","article-title":"X-ray imaging with high-Z sensors for the ESRF-EBS Upgrade","volume":"14","author":"Tsigaridas","year":"2019","journal-title":"J. Inst."},{"key":"ref_8","first-page":"P10011","article-title":"A 10 cm \u00d7 10 cm CdTe Spectroscopic Imaging Detector based on the HEXITEC ASIC","volume":"10","author":"Wilson","year":"2015","journal-title":"J. Inst."},{"key":"ref_9","doi-asserted-by":"crossref","first-page":"106","DOI":"10.1016\/j.nima.2018.03.006","article-title":"Spectral response characterization of CdTe sensors of different pixel size with the IBEX ASIC","volume":"892","author":"Zambon","year":"2018","journal-title":"Nucl. Instrum. Methods Phys. Res. Sect. A"},{"key":"ref_10","doi-asserted-by":"crossref","first-page":"34","DOI":"10.1016\/j.nima.2009.01.046","article-title":"HEXITEC ASIC \u2013 A pixelated readout chip for CZT detectors","volume":"604","author":"Jones","year":"2009","journal-title":"Nucl. Instrum. Methods Phys. Res. Sect. A"},{"key":"ref_11","first-page":"C02010","article-title":"Interconnect and bonding techniques for pixelated X-ray and gamma-ray detectors","volume":"10","author":"Schneider","year":"2015","journal-title":"J. Inst."},{"key":"ref_12","doi-asserted-by":"crossref","first-page":"15988","DOI":"10.1038\/srep15988","article-title":"Mapping of multi-elements during melting and solidification using synchrotron X-rays and pixel-based spectroscopy","volume":"5","author":"Liotti","year":"2015","journal-title":"Sci. Rep."},{"key":"ref_13","doi-asserted-by":"crossref","first-page":"15979","DOI":"10.1038\/srep15979","article-title":"3D chemical imaging in the laboratory by hyperspectral X-ray computed tomography","volume":"5","author":"Egan","year":"2015","journal-title":"Sci. Rep."},{"key":"ref_14","doi-asserted-by":"crossref","first-page":"99151D","DOI":"10.1117\/12.2234655","article-title":"The HEXITC hard x-ray pixelated CdTe imager for fast solar observation","volume":"9915","author":"Baumgartner","year":"2016","journal-title":"Proc. SPIE"},{"key":"ref_15","doi-asserted-by":"crossref","first-page":"24622","DOI":"10.1038\/srep24622","article-title":"Intrinsic beam emittance of laser-accelerated electrons measured by x-ray spectroscopic imaging","volume":"6","author":"Golovin","year":"2016","journal-title":"Sci. Rep."},{"key":"ref_16","doi-asserted-by":"crossref","first-page":"28","DOI":"10.1080\/08940886.2018.1528431","article-title":"HEXITEC: A High-Energy X-ray Spectroscopic Imaging Detector for Synchrotron Applications","volume":"31","author":"Veale","year":"2018","journal-title":"Sync. Rad. News"},{"key":"ref_17","doi-asserted-by":"crossref","first-page":"218","DOI":"10.1016\/j.nima.2014.08.036","article-title":"Measurements of charge sharing in small pixel CdTe detectors","volume":"767","author":"Veale","year":"2014","journal-title":"Nucl. Instrum. Methods Phys. Res. Sect. A"},{"key":"ref_18","doi-asserted-by":"crossref","first-page":"18","DOI":"10.1016\/j.nima.2004.05.071","article-title":"Compound semiconductor radiation detectors","volume":"531","author":"Owens","year":"2004","journal-title":"Nucl. Instrum. Methods Phys. Res. Sect. A"},{"key":"ref_19","first-page":"106","article-title":"Second generation of portable gamma camera based on Caliste CdTe hybrid technology","volume":"892","author":"Maier","year":"2018","journal-title":"Nucl. Instrum. Methods Phys. Res. Sect. A"},{"key":"ref_20","doi-asserted-by":"crossref","first-page":"777","DOI":"10.1109\/TNS.2008.2008806","article-title":"High Energy Resolution Hard X-Ray and Gamma-Ray Imagers Using CdTe Diode Devices","volume":"56","author":"Watanabe","year":"2009","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"ref_21","first-page":"P10018","article-title":"Edge effects in a small pixel CdTe for X-ray imaging","volume":"8","author":"Duarte","year":"2013","journal-title":"J. Inst."},{"key":"ref_22","doi-asserted-by":"crossref","unstructured":"Iniewski, K., Chen, H., Bindley, G., Kuvvetli, I., and Budtz-Jorgensen, C. (November, January 26). Modeling charge-sharing effects in pixelated CZT detectors. Proceedings of the 2007 IEEE Nuclear Science Symposium Conference Record, Honolulu, HI, USA.","DOI":"10.1109\/NSSMIC.2007.4437135"},{"key":"ref_23","doi-asserted-by":"crossref","first-page":"265","DOI":"10.1016\/j.nima.2013.07.054","article-title":"Synchrotron characterization of non-uniformities in a small pixel cadmium zinc telluride detector","volume":"729","author":"Veale","year":"2013","journal-title":"Nucl. Instrum. Methods Phys. Res. Sect. A"},{"key":"ref_24","doi-asserted-by":"crossref","first-page":"142","DOI":"10.1016\/j.nima.2019.06.017","article-title":"Energy-loss correction in charge sharing events for improved performance of pixelated compound semiconductors","volume":"940","author":"Bugby","year":"2019","journal-title":"Nucl. Instrum. Methods Phys. Res. Sect. A"},{"key":"ref_25","doi-asserted-by":"crossref","first-page":"37","DOI":"10.1016\/j.nima.2019.01.045","article-title":"Improved spectroscopic performance in compound semiconductors for high rate X-ray and gamma-ray imagig applications: A novel depth of interaction correction technique","volume":"927","author":"Veale","year":"2019","journal-title":"Nucl. Instrum. Methods Phys. Res. Sect. A"},{"key":"ref_26","doi-asserted-by":"crossref","first-page":"1078","DOI":"10.1107\/S1600577518006422","article-title":"Dual-polarity pulse processing and analysis for charge-loss correction in cadmium-zinc-telluride pixel detectors","volume":"25","author":"Abbene","year":"2018","journal-title":"J. Sync. Rad."},{"key":"ref_27","first-page":"P07017","article-title":"X-ray micro-beam characterization of a small pixel CdTe detector","volume":"7","author":"Veale","year":"2012","journal-title":"J. Inst."},{"key":"ref_28","doi-asserted-by":"crossref","first-page":"199","DOI":"10.1109\/TNS.2012.2232306","article-title":"Effects of Dislocation Walls on Image Quality When Using Cadmium Telluride X-ray Detectors","volume":"60","author":"Buis","year":"2013","journal-title":"Tran. Nucl. Sci."},{"key":"ref_29","first-page":"C12023","article-title":"Characterisation of GaAs:Cr pixel sensors coupled to Timepix chips in view of synchrotron applications","volume":"12","author":"Ponchut","year":"2017","journal-title":"J. Inst."},{"key":"ref_30","doi-asserted-by":"crossref","first-page":"7","DOI":"10.1002\/crat.200410302","article-title":"Dislocation cell structures in melt-grown semiconductor compound crystals","volume":"40","author":"Rudolph","year":"2005","journal-title":"Cryst. Res. Technol."},{"key":"ref_31","doi-asserted-by":"crossref","first-page":"910","DOI":"10.1109\/TNS.2010.2042617","article-title":"Te Inclusions in CZT Detectors: New Method for Correcting Their Adverse Effects","volume":"57","author":"Bolotnikov","year":"2010","journal-title":"Tran. Nucl. Sci."},{"key":"ref_32","doi-asserted-by":"crossref","first-page":"1854","DOI":"10.1109\/TNS.2016.2556318","article-title":"CdZnTe Detectors Operating at X-ray Fluxes of 100 Million Photons\/(mm2.sec)","volume":"63","author":"Prokesch","year":"2016","journal-title":"Tran. Nucl. Sci."},{"key":"ref_33","doi-asserted-by":"crossref","first-page":"102113","DOI":"10.1063\/1.3099051","article-title":"The polarization mechanism in CdTe Schottky detectors","volume":"94","author":"Cola","year":"2009","journal-title":"Appl. Phys. Lett."},{"key":"ref_34","doi-asserted-by":"crossref","first-page":"252","DOI":"10.1109\/TNS.2016.2516827","article-title":"Evaluation of Polarization effects of e- Collection Schottky CdTe Medipix3RX Hybrid Pixel Detector","volume":"63","author":"Astromskas","year":"2016","journal-title":"Tran. Nucl. Sci."},{"key":"ref_35","doi-asserted-by":"crossref","first-page":"101","DOI":"10.1016\/j.nima.2015.10.092","article-title":"Development of a Schottky CdTe Medipix3RX hybrid photon counting detector with spatial and energy resolving capabilities","volume":"824","author":"Gimenez","year":"2016","journal-title":"Nucl. Instrum. Methods Phys. Res. Sect. 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