{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,7,30]],"date-time":"2024-07-30T08:25:23Z","timestamp":1722327923625},"reference-count":16,"publisher":"MDPI AG","issue":"8","license":[{"start":{"date-parts":[[2012,8,2]],"date-time":"2012-08-02T00:00:00Z","timestamp":1343865600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Sensors"],"abstract":"In this paper, a polyvinylidene fluoride (PVDF) piezoelectric transducer was developed to detect laser-induced surface acoustic waves in a SiO2-thin film\u2013Si-substrate structure. In order to solve the problems related to, firstly, the position of the probe, and secondly, the fact that signals at different points cannot be detected simultaneously during the detection process, a four-quadrant surface acoustic wave PVDF transducer was designed and constructed for the purpose of detecting surface acoustic waves excited by a pulse laser line source. The experimental results of the four-quadrant piezoelectric detection in comparison with the commercial nanoindentation technology were consistent, the relative error is 0.56%, and the system eliminates the piezoelectric surface wave detection direction deviation errors, improves the accuracy of the testing system by 1.30%, achieving the acquisition at the same time at different testing positions of the sample.<\/jats:p>","DOI":"10.3390\/s120810500","type":"journal-article","created":{"date-parts":[[2012,8,2]],"date-time":"2012-08-02T15:04:55Z","timestamp":1343919895000},"page":"10500-10510","source":"Crossref","is-referenced-by-count":11,"title":["A Four-Quadrant PVDF Transducer for Surface Acoustic Wave Detection"],"prefix":"10.3390","volume":"12","author":[{"given":"Zimo","family":"Lu","sequence":"first","affiliation":[{"name":"State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Weijin Road, No. 92, Tianjin 300072, China"}]},{"given":"Dante J.","family":"Dorantes-Gonzalez","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Weijin Road, No. 92, Tianjin 300072, China"}]},{"given":"Kun","family":"Chen","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Weijin Road, No. 92, Tianjin 300072, China"}]},{"given":"Fei","family":"Yang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Weijin Road, No. 92, Tianjin 300072, China"}]},{"given":"Baoyin","family":"Jin","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Weijin Road, No. 92, Tianjin 300072, China"}]},{"given":"Yanning","family":"Li","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Weijin Road, No. 92, Tianjin 300072, China"}]},{"given":"Zhi","family":"Chen","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Weijin Road, No. 92, Tianjin 300072, China"}]},{"given":"Xiaotang","family":"Hu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Weijin Road, No. 92, Tianjin 300072, China"}]}],"member":"1968","published-online":{"date-parts":[[2012,8,2]]},"reference":[{"key":"ref_1","doi-asserted-by":"crossref","first-page":"201","DOI":"10.1016\/S0257-8972(99)00546-0","article-title":"A comparative study of the nanoscratching behavior of amorphous carbon films grown under various deposition conditions","volume":"125","author":"Charitidis","year":"2000","journal-title":"Surf. 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Phys."},{"key":"ref_8","doi-asserted-by":"crossref","first-page":"4992","DOI":"10.1063\/1.324445","article-title":"Piezoelectricity and pyroelectricity in polyvinylidene fluoride\u2014A model","volume":"49","author":"Broadhurst","year":"1978","journal-title":"J. Appl. Phys."},{"key":"ref_9","doi-asserted-by":"crossref","first-page":"27","DOI":"10.1117\/12.130586","article-title":"New developments in piezoelectric polymer ultrasound transducers and transducer systems","volume":"1733","author":"Brown","year":"1992","journal-title":"Proc. SPIE"},{"key":"ref_10","doi-asserted-by":"crossref","first-page":"549","DOI":"10.1016\/0924-4247(91)87047-7","article-title":"Ultrasonic transducers with piezoelectric polymer foil","volume":"26","author":"Harnisch","year":"1991","journal-title":"Sens. Actuators A"},{"key":"ref_11","doi-asserted-by":"crossref","first-page":"48","DOI":"10.1016\/j.sna.2007.04.002","article-title":"Pressure sensor from a PVDF film","volume":"142","author":"Shirinov","year":"2008","journal-title":"Sens. Actuators A"},{"key":"ref_12","doi-asserted-by":"crossref","first-page":"237","DOI":"10.1016\/S0924-4247(98)00050-8","article-title":"Monolithic pyroelectric infrared image sensor using PVDF thin film","volume":"66","author":"Fujitsuka","year":"1998","journal-title":"Sens. Actuators A"},{"key":"ref_13","doi-asserted-by":"crossref","first-page":"224","DOI":"10.1007\/BF02319662","article-title":"Characterization of piezo-film sensors for direct vibration and impact measurements","volume":"35","author":"Jenq","year":"1995","journal-title":"Exp. 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