{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,29]],"date-time":"2022-03-29T21:00:54Z","timestamp":1648587654020},"reference-count":15,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"12","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Trans. Fundamentals"],"published-print":{"date-parts":[[2011]]},"DOI":"10.1587\/transfun.e94.a.2537","type":"journal-article","created":{"date-parts":[[2011,12,2]],"date-time":"2011-12-02T14:19:38Z","timestamp":1322835578000},"page":"2537-2544","source":"Crossref","is-referenced-by-count":1,"title":["Extracting Device-Parameter Variations with RO-Based Sensors"],"prefix":"10.1587","volume":"E94-A","author":[{"given":"Ken-ichi","family":"SHINKAI","sequence":"first","affiliation":[{"name":"Department of Information Systems Engineering, Osaka University"}]},{"given":"Masanori","family":"HASHIMOTO","sequence":"additional","affiliation":[{"name":"Department of Information Systems Engineering, Osaka University"}]},{"given":"Takao","family":"ONOYE","sequence":"additional","affiliation":[{"name":"Department of Information Systems Engineering, Osaka University"}]}],"member":"532","reference":[{"key":"1","unstructured":"[1] H. Masuda, S. Ohkawa, A. Kurokawa, and M. Aoki, “Challenge: Variability characterization and modeling for 65- to 90-nm processes,” Proc. CICC, pp.593-599, 2005."},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1093\/ietele\/e89-c.3.342"},{"key":"3","doi-asserted-by":"crossref","unstructured":"[3] S. Martin, K. Flautner, T. Mudge, and D. Blaauw, “Combined dynamic voltage scaling and adaptive body biasing for lower power microprocessors under dynamic workloads,” Proc. ICCAD. ACM, pp.721-725, 2002.","DOI":"10.1145\/774572.774678"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.803949"},{"key":"5","doi-asserted-by":"crossref","unstructured":"[5] M. Bhushan, M. Ketchen, S. Polonsky, and A. Gattiker, “Ring oscillator based technique for measuring variability statistics,” ICMTS, pp.87-92, 2006.","DOI":"10.1109\/ICMTS.2006.1614281"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2015789"},{"key":"7","doi-asserted-by":"crossref","unstructured":"[7] I.A.K.M. Mahfuzul, A. Tsuchiya, K. Kobayashi, and H. Onodera, “Process-sensitive monitor circuits for estimation of die-to-die process variability,” Proc. TAU, pp.83-88, 2010.","DOI":"10.1109\/ICMTS.2011.5976878"},{"key":"8","unstructured":"[8] B. Wan, J. Wang, G. Keskin, and L.T. Pileggi, “Ring oscillators for single process-parameter monitoring,” Proc. Workshop on Test Structure Design for Variability Characterization, 2008."},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.907047"},{"key":"10","doi-asserted-by":"crossref","unstructured":"[10] T. Takahashi, T. Uezono, M. Shintani, K. Masu, and T. Sato, “On-die parameter extraction from path-delay measurements,” Proc. ASSCC, pp.101-104, 2009.","DOI":"10.1109\/ASSCC.2009.5357189"},{"key":"11","doi-asserted-by":"crossref","unstructured":"[11] J. Demmel, “On condition numbers and the distance to the nearest ill-posed problem,” Numerische Mathematik, vol.51, no.3, pp.251-289, 1987.","DOI":"10.1007\/BF01400115"},{"key":"12","unstructured":"[12] A. Bourdonnaye and M. Tolentino, “Reducing the condition number for microlocal discretization problems,” Philosophical Trans. the Royal Society of London. Series A, vol.362, no.1816, pp.541-559, 2004."},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1989.572629"},{"key":"14","unstructured":"[14] HSPICE Documentation, Synopsys."},{"key":"15","unstructured":"[15] R. [Online]. Available: http:\/\/www.r-project.org\/"}],"container-title":["IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/www.jstage.jst.go.jp\/article\/transfun\/E94.A\/12\/E94.A_12_2537\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,4,26]],"date-time":"2021-04-26T05:44:53Z","timestamp":1619415893000},"score":1,"resource":{"primary":{"URL":"http:\/\/www.jstage.jst.go.jp\/article\/transfun\/E94.A\/12\/E94.A_12_2537\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011]]},"references-count":15,"journal-issue":{"issue":"12","published-print":{"date-parts":[[2011]]}},"URL":"https:\/\/doi.org\/10.1587\/transfun.e94.a.2537","relation":{},"ISSN":["0916-8508","1745-1337"],"issn-type":[{"value":"0916-8508","type":"print"},{"value":"1745-1337","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011]]}}}