{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,4,7]],"date-time":"2024-04-07T08:30:53Z","timestamp":1712478653302},"reference-count":22,"publisher":"Informa UK Limited","issue":"1","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Technometrics"],"published-print":{"date-parts":[[2003,2]]},"DOI":"10.1198\/004017002188618699","type":"journal-article","created":{"date-parts":[[2006,5,10]],"date-time":"2006-05-10T19:15:59Z","timestamp":1147288559000},"page":"47-57","source":"Crossref","is-referenced-by-count":28,"title":["Model-Robust Test Plans With Applications in Accelerated Life Testing"],"prefix":"10.1198","volume":"45","author":[{"given":"Francis G","family":"Pascual","sequence":"first","affiliation":[]},{"given":"Grace","family":"Montepiedra","sequence":"additional","affiliation":[]}],"member":"301","reference":[{"key":"p_1","doi-asserted-by":"publisher","DOI":"10.2307\/2282542"},{"key":"p_2","doi-asserted-by":"publisher","DOI":"10.1016\/0378-3758(92)90071-Y"},{"key":"p_3","doi-asserted-by":"publisher","DOI":"10.1214\/aoms\/1177728915"},{"key":"p_4","doi-asserted-by":"publisher","DOI":"10.1080\/02331889508802474"},{"key":"p_5","doi-asserted-by":"publisher","DOI":"10.1145\/355958.355966"},{"key":"p_6","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1176347878"},{"key":"p_7","doi-asserted-by":"publisher","DOI":"10.1016\/0378-3758(93)90047-A"},{"key":"p_8","doi-asserted-by":"publisher","DOI":"10.1016\/0378-3758(92)00153-U"},{"key":"p_9","first-page":"459","volume":"5","author":"Dette H.","year":"1995","journal-title":"Statistica Sinica"},{"key":"p_10","doi-asserted-by":"publisher","DOI":"10.2307\/2986276"},{"key":"p_11","doi-asserted-by":"crossref","first-page":"379","DOI":"10.1080\/02331887408801175","volume":"5","author":"Lauter E.","year":"1974","journal-title":"Mathematische operationsforschung und Statistik"},{"key":"p_12","doi-asserted-by":"publisher","DOI":"10.2307\/1268110"},{"key":"p_14","doi-asserted-by":"publisher","DOI":"10.2307\/1267877"},{"key":"p_16","doi-asserted-by":"publisher","DOI":"10.2307\/1269200"},{"key":"p_18","doi-asserted-by":"publisher","DOI":"10.1016\/S0378-3758(96)00199-1"},{"key":"p_20","first-page":"12309","author":"Nelson W.","year":"1998","journal-title":"NY"},{"key":"p_21","first-page":"310","author":"Nelson W.","year":"1975","journal-title":"IEEE Transactions on Reliability, R-24"},{"key":"p_22","doi-asserted-by":"publisher","DOI":"10.2307\/1267923"},{"key":"p_23","doi-asserted-by":"publisher","DOI":"10.2307\/1268710"},{"key":"p_24","doi-asserted-by":"publisher","DOI":"10.2307\/2283928"},{"key":"p_25","doi-asserted-by":"publisher","DOI":"10.1016\/S0378-3758(97)00039-6"},{"key":"p_26","doi-asserted-by":"publisher","DOI":"10.1016\/0378-3758(95)00187-5"}],"container-title":["Technometrics"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/www.tandfonline.com\/doi\/pdf\/10.1198\/004017002188618699","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,4,18]],"date-time":"2019-04-18T15:25:09Z","timestamp":1555601109000},"score":1,"resource":{"primary":{"URL":"http:\/\/www.tandfonline.com\/doi\/abs\/10.1198\/004017002188618699"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003,2]]},"references-count":22,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2003,2]]}},"alternative-id":["10.1198\/004017002188618699"],"URL":"https:\/\/doi.org\/10.1198\/004017002188618699","relation":{},"ISSN":["0040-1706","1537-2723"],"issn-type":[{"value":"0040-1706","type":"print"},{"value":"1537-2723","type":"electronic"}],"subject":[],"published":{"date-parts":[[2003,2]]}}}