{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,2]],"date-time":"2024-08-02T00:31:44Z","timestamp":1722558704148},"reference-count":29,"publisher":"SAGE Publications","issue":"12","license":[{"start":{"date-parts":[[2024,2,18]],"date-time":"2024-02-18T00:00:00Z","timestamp":1708214400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/journals.sagepub.com\/page\/policies\/text-and-data-mining-license"}],"content-domain":{"domain":["journals.sagepub.com"],"crossmark-restriction":true},"short-container-title":["Transactions of the Institute of Measurement and Control"],"published-print":{"date-parts":[[2024,8]]},"abstract":" This research paper proposes a new implementation of a long short-term memory network for active fault-tolerant control subjected to single and multiple undiagnosable sensor faults. There are two networks used: the first performs as a diagnosis for automated manufacturing systems and can identify faulty sensors, while the second acts as an inverse model of these systems and is used to determine the reconfigured control action to take when sensors are not functioning as expected. The Factory I\/O simulator is interfaced with MATLAB to simulate and verify the proposed approach for automated material handling case study with faultless and multiple fault sensors. Four sensors of the case study out of six are tolerated. <\/jats:p>","DOI":"10.1177\/01423312241229493","type":"journal-article","created":{"date-parts":[[2024,2,19]],"date-time":"2024-02-19T07:15:55Z","timestamp":1708326955000},"page":"2289-2299","update-policy":"http:\/\/dx.doi.org\/10.1177\/sage-journals-update-policy","source":"Crossref","is-referenced-by-count":0,"title":["Deep-learning-based design of active fault-tolerant control for automated manufacturing systems subjected to faulty sensors"],"prefix":"10.1177","volume":"46","author":[{"ORCID":"http:\/\/orcid.org\/0000-0002-6006-9507","authenticated-orcid":false,"given":"Mostafa H","family":"El-Mahdy","sequence":"first","affiliation":[{"name":"Mechatronics Engineering Department, Faculty of Engineering, Ahram Canadian University, Egypt"}]},{"ORCID":"http:\/\/orcid.org\/0000-0001-8641-9985","authenticated-orcid":false,"given":"Mohammed I","family":"Awad","sequence":"additional","affiliation":[{"name":"Mechatronics Engineering Department, Faculty of Engineering, Ain Shams University, Egypt"}]},{"ORCID":"http:\/\/orcid.org\/0000-0002-0367-0187","authenticated-orcid":false,"given":"Shady A","family":"Maged","sequence":"additional","affiliation":[{"name":"Mechatronics Engineering Department, Faculty of Engineering, Ain Shams University, Egypt"}]}],"member":"179","published-online":{"date-parts":[[2024,2,18]]},"reference":[{"doi-asserted-by":"publisher","key":"bibr1-01423312241229493","DOI":"10.1016\/j.mechatronics.2009.02.007"},{"doi-asserted-by":"publisher","key":"bibr2-01423312241229493","DOI":"10.1016\/j.measurement.2019.04.083"},{"doi-asserted-by":"publisher","key":"bibr3-01423312241229493","DOI":"10.1109\/TMECH.2021.3100150"},{"doi-asserted-by":"publisher","key":"bibr4-01423312241229493","DOI":"10.1007\/978-3-662-47943-8"},{"doi-asserted-by":"publisher","key":"bibr5-01423312241229493","DOI":"10.1016\/j.ifacol.2021.04.034"},{"doi-asserted-by":"publisher","key":"bibr6-01423312241229493","DOI":"10.1007\/978-3-662-62004-5"},{"doi-asserted-by":"publisher","key":"bibr7-01423312241229493","DOI":"10.1109\/ICENCO49852.2021.9698832"},{"doi-asserted-by":"publisher","key":"bibr8-01423312241229493","DOI":"10.1109\/MIUCC55081.2022.9781748"},{"doi-asserted-by":"publisher","key":"bibr9-01423312241229493","DOI":"10.1016\/j.ifacol.2018.09.533"},{"doi-asserted-by":"publisher","key":"bibr10-01423312241229493","DOI":"10.1162\/neco.1997.9.8.1735"},{"doi-asserted-by":"publisher","key":"bibr11-01423312241229493","DOI":"10.1016\/j.arcontrol.2012.03.005"},{"doi-asserted-by":"publisher","key":"bibr12-01423312241229493","DOI":"10.1016\/j.ifacol.2015.09.569"},{"key":"bibr13-01423312241229493","first-page":"1","volume-title":"3rd international Conference on learning representations, ICLR\u2014conference track proceedings","author":"Kingma DP","year":"2015"},{"doi-asserted-by":"publisher","key":"bibr14-01423312241229493","DOI":"10.1016\/j.ifacol.2018.08.474"},{"doi-asserted-by":"publisher","key":"bibr15-01423312241229493","DOI":"10.1016\/j.arcontrol.2018.04.002"},{"doi-asserted-by":"publisher","key":"bibr16-01423312241229493","DOI":"10.1016\/j.isatra.2018.04.005"},{"year":"2023","author":"Ma G","journal-title":"Transactions of the Institute of Measurement and Control","key":"bibr17-01423312241229493"},{"doi-asserted-by":"publisher","key":"bibr18-01423312241229493","DOI":"10.1177\/01423312221107971"},{"doi-asserted-by":"publisher","key":"bibr19-01423312241229493","DOI":"10.3390\/s19214612"},{"doi-asserted-by":"publisher","key":"bibr20-01423312241229493","DOI":"10.1016\/j.ifacol.2019.09.141"},{"doi-asserted-by":"publisher","key":"bibr21-01423312241229493","DOI":"10.1016\/j.ifacol.2019.09.178"},{"doi-asserted-by":"publisher","key":"bibr22-01423312241229493","DOI":"10.1136\/qshc.4.2.80"},{"doi-asserted-by":"publisher","key":"bibr23-01423312241229493","DOI":"10.4324\/9781315092898-2"},{"issue":"2","key":"bibr24-01423312241229493","first-page":"115","volume":"13","author":"Rodriguez-guerra J","year":"2018","journal-title":"ICFTCFD 2018 : 20th International Conference on Fault-Tolerant Control and Fault Detection"},{"doi-asserted-by":"publisher","key":"bibr25-01423312241229493","DOI":"10.1109\/CoDIT.2019.8820585"},{"doi-asserted-by":"publisher","key":"bibr26-01423312241229493","DOI":"10.1016\/j.arcontrol.2013.09.009"},{"doi-asserted-by":"publisher","key":"bibr27-01423312241229493","DOI":"10.1016\/j.arcontrol.2008.03.008"},{"doi-asserted-by":"publisher","key":"bibr28-01423312241229493","DOI":"10.1016\/j.ress.2008.06.002"},{"doi-asserted-by":"publisher","key":"bibr29-01423312241229493","DOI":"10.1021\/ie071064m"}],"container-title":["Transactions of the Institute of Measurement and Control"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/journals.sagepub.com\/doi\/pdf\/10.1177\/01423312241229493","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/journals.sagepub.com\/doi\/full-xml\/10.1177\/01423312241229493","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/journals.sagepub.com\/doi\/pdf\/10.1177\/01423312241229493","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T07:15:46Z","timestamp":1722496546000},"score":1,"resource":{"primary":{"URL":"https:\/\/journals.sagepub.com\/doi\/10.1177\/01423312241229493"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,2,18]]},"references-count":29,"journal-issue":{"issue":"12","published-print":{"date-parts":[[2024,8]]}},"alternative-id":["10.1177\/01423312241229493"],"URL":"https:\/\/doi.org\/10.1177\/01423312241229493","relation":{},"ISSN":["0142-3312","1477-0369"],"issn-type":[{"type":"print","value":"0142-3312"},{"type":"electronic","value":"1477-0369"}],"subject":[],"published":{"date-parts":[[2024,2,18]]}}}