{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,11,5]],"date-time":"2023-11-05T01:23:57Z","timestamp":1699147437951},"reference-count":6,"publisher":"Hindawi Limited","license":[{"start":{"date-parts":[[2010,3,23]],"date-time":"2010-03-23T00:00:00Z","timestamp":1269302400000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["VLSI Design"],"published-print":{"date-parts":[[2010,3,23]]},"abstract":"The run length based coding schemes have been very effective for\nthe test data compression in case of current generation SoCs with\na large number of IP cores. The first part of paper presents a\nsurvey of the run length based codes. The data compression of any\npartially specified test data depends upon how the unspecified\nbits are filled with 1s and 0s. In the second part of the paper,\nthe five different approaches for \u201cdon't care\u201d bit\nfilling based on nature of runs are proposed to predict the\nmaximum compression based on entropy. Here the various run length\nbased schemes are compared with maximum data compression limit\nbased on entropy bounds. The actual compressions claimed by the\nauthors are also compared. For various ISCAS circuits, it has been\nshown that when the X filling is done considering runs of zeros\nfollowed by one as well as runs of ones followed by zero (i.e.,\nExtended FDR), it provides the maximum data compression. In third\npart, it has been shown that the average test power and peak power\nis minimum when the don't care bits are filled to make the\nlong runs of 0s as well as 1s.<\/jats:p>","DOI":"10.1155\/2010\/670476","type":"journal-article","created":{"date-parts":[[2010,3,23]],"date-time":"2010-03-23T15:30:26Z","timestamp":1269358226000},"page":"1-9","source":"Crossref","is-referenced-by-count":14,"title":["Run-Length-Based Test Data Compression Techniques: How Far from Entropy and Power Bounds?\u2014A Survey"],"prefix":"10.1155","volume":"2010","author":[{"given":"Usha S.","family":"Mehta","sequence":"first","affiliation":[{"name":"Department of Electronics and Communication, Nirma University, Ahmedabad 382481, India"}]},{"given":"Kankar S.","family":"Dasgupta","sequence":"additional","affiliation":[{"name":"Space Application Center, ISRO, Ahmedabad 380015, India"}]},{"given":"Niranjan M.","family":"Devashrayee","sequence":"additional","affiliation":[{"name":"Department of Electronics and Communication, Nirma University, Ahmedabad 382481, India"}]}],"member":"98","reference":[{"key":"2","first-page":"294","year":"2006","journal-title":"IEEE Transaction Design & Test of Computers"},{"issue":"6","key":"7","volume":"20","year":"2004","journal-title":"Journal of Electronic Testing"},{"issue":"8","key":"10","doi-asserted-by":"crossref","first-page":"1076","DOI":"10.1109\/TC.2003.1223641","volume":"52","year":"2003","journal-title":"IEEE Transactions on Computers"},{"issue":"6","key":"14","doi-asserted-by":"crossref","first-page":"783","DOI":"10.1109\/TCAD.2003.811451","volume":"22","year":"2003","journal-title":"IEEE Transactions on Computer-Aided Design"},{"issue":"4","key":"19","doi-asserted-by":"crossref","first-page":"545","DOI":"10.1109\/TC.2007.1007","volume":"56","year":"2007","journal-title":"IEEE Transactions on Computers"},{"issue":"11","key":"21","doi-asserted-by":"crossref","first-page":"877","DOI":"10.1016\/j.sysarc.2007.02.006","volume":"53","year":"2007","journal-title":"Journal of Systems Architecture"}],"container-title":["VLSI Design"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/archive\/2010\/670476.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/archive\/2010\/670476.xml","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/downloads.hindawi.com\/archive\/2010\/670476.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,12,9]],"date-time":"2020-12-09T06:06:52Z","timestamp":1607494012000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.hindawi.com\/journals\/vlsi\/2010\/670476\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3,23]]},"references-count":6,"alternative-id":["670476","670476"],"URL":"https:\/\/doi.org\/10.1155\/2010\/670476","relation":{},"ISSN":["1065-514X","1563-5171"],"issn-type":[{"value":"1065-514X","type":"print"},{"value":"1563-5171","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,3,23]]}}}