{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,1,23]],"date-time":"2024-01-23T23:20:11Z","timestamp":1706052011686},"reference-count":17,"publisher":"Hindawi Limited","license":[{"start":{"date-parts":[[2010,2,16]],"date-time":"2010-02-16T00:00:00Z","timestamp":1266278400000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"funder":[{"name":"NASA ETDP Program"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["VLSI Design"],"published-print":{"date-parts":[[2010,2,16]]},"abstract":"An instrumentation channel is designed, implemented, and tested in a 0.5-\u03bc<\/mml:mi><\/mml:math>m SiGe BiCMOS process. The circuit features a reconfigurable Wheatstone bridge network that interfaces an assortment of external sensors to signal processing circuits. Also, analog sampling is implemented in the channel using a flying capacitor configuration. The analog samples are digitized by a low-power multichannel A\/D converter. Measurement results show that the instrumentation channel supports input signals up to 200\u2009Hz and operates across a wide temperature range of -<\/mml:mo>180<\/mml:mn>\u00b0<\/mml:mo><\/mml:msup>C<\/mml:mtext><\/mml:math> to 125<\/mml:mn>\u00b0<\/mml:mo><\/mml:msup>C<\/mml:mtext><\/mml:math>. This work demonstrates the use of a commercially available first generation SiGe BiCMOS process in designing circuits suitable for extreme environment applications.<\/jats:p>","DOI":"10.1155\/2010\/156829","type":"journal-article","created":{"date-parts":[[2010,2,16]],"date-time":"2010-02-16T15:30:43Z","timestamp":1266334243000},"page":"1-12","source":"Crossref","is-referenced-by-count":5,"title":["A SiGe BiCMOS Instrumentation Channel for Extreme Environment Applications"],"prefix":"10.1155","volume":"2010","author":[{"given":"Chandradevi","family":"Ulaganathan","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering and Computer Science, The University of Tennessee, Knoxville, TN 37996, USA"}]},{"given":"Neena","family":"Nambiar","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Computer Science, The University of Tennessee, Knoxville, TN 37996, USA"}]},{"given":"Kimberly","family":"Cornett","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, University of Arkansas, Fayetteville, AR 72701, USA"}]},{"given":"Robert L.","family":"Greenwell","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Computer Science, The University of Tennessee, Knoxville, TN 37996, USA"}]},{"given":"Jeremy A.","family":"Yager","sequence":"additional","affiliation":[{"name":"Power and Sensor Electronics, Jet Propulsion Laboratory, Pasadena, CA 91109, USA"}]},{"given":"Benjamin S.","family":"Prothro","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Computer Science, The University of Tennessee, Knoxville, TN 37996, USA"}]},{"given":"Kevin","family":"Tham","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Computer Science, The University of Tennessee, Knoxville, TN 37996, USA"}]},{"given":"Suheng","family":"Chen","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Computer Science, The University of Tennessee, Knoxville, TN 37996, USA"}]},{"given":"Richard S.","family":"Broughton","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, University of Arkansas, Fayetteville, AR 72701, USA"}]},{"given":"Guoyuan","family":"Fu","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, University of Arkansas, Fayetteville, AR 72701, USA"}]},{"given":"Benjamin J.","family":"Blalock","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Computer Science, The University of Tennessee, Knoxville, TN 37996, USA"}]},{"given":"Charles L.","family":"Britton","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Computer Science, The University of Tennessee, Knoxville, TN 37996, USA"}]},{"given":"M. Nance","family":"Ericson","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Computer Science, The University of Tennessee, Knoxville, TN 37996, USA"}]},{"given":"H. 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