{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,8]],"date-time":"2024-08-08T05:10:01Z","timestamp":1723093801956},"reference-count":0,"publisher":"Wiley","issue":"1","license":[{"start":{"date-parts":[[2000,1,1]],"date-time":"2000-01-01T00:00:00Z","timestamp":946684800000},"content-version":"vor","delay-in-days":2551,"URL":"http:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["VLSI Design"],"published-print":{"date-parts":[[1994,1]]},"abstract":"Test generation for sequential VLSI circuits has remained a difficult problem to solve. The difficulty arises because\nof reasoning about temporal behavior of sequential circuits. We use temporal logic to model digital circuits.\nTemporal Logic can model circuits hierarchically. A set of heuristics is given to aid during test generation. A\nhierarchical test generation algorithm is proposed.<\/jats:p>","DOI":"10.1155\/1994\/94514","type":"journal-article","created":{"date-parts":[[2007,9,18]],"date-time":"2007-09-18T12:56:35Z","timestamp":1190120195000},"page":"69-80","source":"Crossref","is-referenced-by-count":2,"title":["Temporal Logic Based Hierarchical Test Generationfor Sequential VLSI Circuits"],"prefix":"10.1155","volume":"2","author":[{"given":"Anand V.","family":"Hudli","sequence":"first","affiliation":[]},{"given":"Raghu V.","family":"Hudli","sequence":"additional","affiliation":[]}],"member":"311","published-online":{"date-parts":[[1993,1,6]]},"container-title":["VLSI Design"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/archive\/1994\/094514.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1155\/1994\/94514","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,8]],"date-time":"2024-08-08T04:44:15Z","timestamp":1723092255000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1155\/1994\/94514"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1993,1,6]]},"references-count":0,"journal-issue":{"issue":"1","published-print":{"date-parts":[[1994,1]]}},"alternative-id":["10.1155\/1994\/94514"],"URL":"https:\/\/doi.org\/10.1155\/1994\/94514","archive":["Portico"],"relation":{},"ISSN":["1065-514X","1563-5171"],"issn-type":[{"type":"print","value":"1065-514X"},{"type":"electronic","value":"1563-5171"}],"subject":[],"published":{"date-parts":[[1993,1,6]]}}}