{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,8]],"date-time":"2024-08-08T00:40:02Z","timestamp":1723077602015},"reference-count":0,"publisher":"Wiley","issue":"3","license":[{"start":{"date-parts":[[2000,1,1]],"date-time":"2000-01-01T00:00:00Z","timestamp":946684800000},"content-version":"vor","delay-in-days":3221,"URL":"http:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["VLSI Design"],"published-print":{"date-parts":[[1994,1]]},"abstract":"In this paper, we describe a highly efficient automatic test pattern generator for stuck\u2010open (SOP) faults, called\nSOPRANO, in CMOS combinational circuits. The key idea of SOPRANO is to convert a CMOS circuit into an\nequivalent gate level circuit and SOP faults into the equivalent stuck\u2010at faults. Then SOPRANO derives test\npatterns for SOP faults using a gate level test pattern generator. Several techniques to reduce the test set size\nare introduced in SOPRANO. Experimental results performed on eight benchmark circuits show that SOPRANO\nachieves high SOP fault coverage and short processing time.<\/jats:p>","DOI":"10.1155\/1994\/71941","type":"journal-article","created":{"date-parts":[[2007,9,18]],"date-time":"2007-09-18T08:56:35Z","timestamp":1190105795000},"page":"199-207","source":"Crossref","is-referenced-by-count":0,"title":["An Efficient Automatic Test Pattern Generator forStuck\u2010Open Faults in CMOS Combinational Circuits"],"prefix":"10.1155","volume":"2","author":[{"given":"Hyung K.","family":"Lee","sequence":"first","affiliation":[]},{"given":"Dong S.","family":"Ha","sequence":"additional","affiliation":[]}],"member":"311","published-online":{"date-parts":[[1991,3,8]]},"container-title":["VLSI Design"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/archive\/1994\/071941.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1155\/1994\/71941","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,7]],"date-time":"2024-08-07T19:53:10Z","timestamp":1723060390000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1155\/1994\/71941"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1991,3,8]]},"references-count":0,"journal-issue":{"issue":"3","published-print":{"date-parts":[[1994,1]]}},"alternative-id":["10.1155\/1994\/71941"],"URL":"https:\/\/doi.org\/10.1155\/1994\/71941","archive":["Portico"],"relation":{},"ISSN":["1065-514X","1563-5171"],"issn-type":[{"type":"print","value":"1065-514X"},{"type":"electronic","value":"1563-5171"}],"subject":[],"published":{"date-parts":[[1991,3,8]]}}}