{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,8]],"date-time":"2024-08-08T00:10:06Z","timestamp":1723075806889},"reference-count":0,"publisher":"Wiley","issue":"3","license":[{"start":{"date-parts":[[2000,1,1]],"date-time":"2000-01-01T00:00:00Z","timestamp":946684800000},"content-version":"vor","delay-in-days":2476,"URL":"http:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["VLSI Design"],"published-print":{"date-parts":[[1994,1]]},"abstract":"In this paper, we describe algorithms based on Simulated Annealing for selecting a subset of flip\u2010flops to be\nconnected into a scan path. The objective for selection is to maximize the coverage of faults that are aborted by\na sequential fault simulator. We pose the problem as a combinatorial optimization, and present a heuristic algorithm\nbased on Simulated Annealing. The SCOAP testability measure is employed to assess the selection of flip\u2010flops\nduring the course of optimization. Our algorithms form a part of an integrated design package, TOPS, which has\nbeen designed as an enhancement to the OASIS standard\u2010cell design automation system available from MCNC.\nWe discuss the TOPS package and its performance on a number of ISCAS\u203289 benchmarks. We also present a\ncomparative evaluation of the benchmark results.<\/jats:p>","DOI":"10.1155\/1994\/32902","type":"journal-article","created":{"date-parts":[[2007,9,18]],"date-time":"2007-09-18T12:56:35Z","timestamp":1190120195000},"page":"233-239","source":"Crossref","is-referenced-by-count":0,"title":["TOPS: A Target\u2010Oriented Partial Scan DesignPackage Based on Simulated Annealing"],"prefix":"10.1155","volume":"2","author":[{"given":"C. P.","family":"Ravikumar","sequence":"first","affiliation":[]},{"given":"H.","family":"Rasheed","sequence":"additional","affiliation":[]}],"member":"311","published-online":{"date-parts":[[1993,3,22]]},"container-title":["VLSI Design"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/downloads.hindawi.com\/archive\/1994\/032902.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1155\/1994\/32902","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,7]],"date-time":"2024-08-07T23:53:16Z","timestamp":1723074796000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1155\/1994\/32902"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1993,3,22]]},"references-count":0,"journal-issue":{"issue":"3","published-print":{"date-parts":[[1994,1]]}},"alternative-id":["10.1155\/1994\/32902"],"URL":"https:\/\/doi.org\/10.1155\/1994\/32902","archive":["Portico"],"relation":{},"ISSN":["1065-514X","1563-5171"],"issn-type":[{"type":"print","value":"1065-514X"},{"type":"electronic","value":"1563-5171"}],"subject":[],"published":{"date-parts":[[1993,3,22]]}}}