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{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,30]],"date-time":"2024-08-30T17:48:44Z","timestamp":1725040124209},"reference-count":189,"publisher":"Association for Computing Machinery (ACM)","issue":"5","content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":["ACM Comput. Surv."],"published-print":{"date-parts":[[2021,9,30]]},"abstract":"Performance and power constraints come together with Complementary Metal Oxide Semiconductor technology scaling in future Exascale systems. Technology scaling makes each individual transistor more prone to faults and, due to the exponential increase in the number of devices per chip, to higher system fault rates. Consequently, High-performance Computing (HPC) systems need to integrate prediction, detection, and recovery mechanisms to cope with faults efficiently. This article reviews fault detection, fault prediction, and recovery techniques in HPC systems, from electronics to system level. We analyze their strengths and limitations. Finally, we identify the promising paths to meet the reliability levels of Exascale systems.<\/jats:p>","DOI":"10.1145\/3403956","type":"journal-article","created":{"date-parts":[[2020,9,28]],"date-time":"2020-09-28T10:45:25Z","timestamp":1601289925000},"page":"1-32","update-policy":"http:\/\/dx.doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":18,"title":["Predictive Reliability and Fault Management in Exascale Systems"],"prefix":"10.1145","volume":"53","author":[{"given":"Ramon","family":"Canal","sequence":"first","affiliation":[{"name":"Universitat Polit\u00e8cnica de Catalunya (UPC) and Barcelona Supercomputing Center (BSC)"}]},{"given":"Carles","family":"Hernandez","sequence":"additional","affiliation":[{"name":"Universitat Polit\u00e8cnica de Val\u00e8ncia (UPV)"}]},{"given":"Rafa","family":"Tornero","sequence":"additional","affiliation":[{"name":"Universitat Polit\u00e8cnica de Val\u00e8ncia (UPV)"}]},{"given":"Alessandro","family":"Cilardo","sequence":"additional","affiliation":[{"name":"Universit\u00e1 degli studi di Napoli Federico II (UNINA)"}]},{"given":"Giuseppe","family":"Massari","sequence":"additional","affiliation":[{"name":"Politecnico di Milano (POLIMI)"}]},{"given":"Federico","family":"Reghenzani","sequence":"additional","affiliation":[{"name":"Politecnico di Milano (POLIMI)"}]},{"given":"William","family":"Fornaciari","sequence":"additional","affiliation":[{"name":"Politecnico di Milano (POLIMI)"}]},{"given":"Marina","family":"Zapater","sequence":"additional","affiliation":[{"name":"Ecole Polytechnique Federale de Lausanne (EPFL)"}]},{"given":"David","family":"Atienza","sequence":"additional","affiliation":[{"name":"Ecole Polytechnique Federale de Lausanne (EPFL)"}]},{"given":"Ariel","family":"Oleksiak","sequence":"additional","affiliation":[{"name":"Poznan Supercomputing and Networking Center (PSNC)"}]},{"given":"Wojciech","family":"Pi\u0104tek","sequence":"additional","affiliation":[{"name":"Poznan Supercomputing and Networking Center (PSNC)"}]},{"given":"Jaume","family":"Abella","sequence":"additional","affiliation":[{"name":"Barcelona Supercomputing Center (BSC)"}]}],"member":"320","published-online":{"date-parts":[[2020,9,28]]},"reference":[{"key":"e_1_2_1_1_1","volume-title":"Proceedings of the 14th IEEE International On-line Testing Symposium. 3--9. 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