{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T20:44:38Z","timestamp":1730321078150,"version":"3.28.0"},"publisher-location":"New York, NY, USA","reference-count":15,"publisher":"ACM","license":[{"start":{"date-parts":[[2019,4,13]],"date-time":"2019-04-13T00:00:00Z","timestamp":1555113600000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2019,4,13]]},"DOI":"10.1145\/3324033.3324038","type":"proceedings-article","created":{"date-parts":[[2019,6,5]],"date-time":"2019-06-05T12:21:05Z","timestamp":1559737265000},"page":"72-74","update-policy":"http:\/\/dx.doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":1,"title":["Reduction of Threading Dislocation by Using Pattern Sapphire Substrate on GaN to Enhance Schottky Diode's Performance"],"prefix":"10.1145","author":[{"given":"Wen-I","family":"Cheng","sequence":"first","affiliation":[{"name":"Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan"}]},{"given":"Cheng-Yen","family":"Chien","sequence":"additional","affiliation":[{"name":"Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan"}]},{"given":"Bo-Han","family":"Kung","sequence":"additional","affiliation":[{"name":"Graduate Institute of Biomedical Electronics and Bioinformatics, National Taiwan University, Taipei, Taiwan"}]},{"given":"Cheng-Wei","family":"Yen","sequence":"additional","affiliation":[{"name":"Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan"}]},{"given":"Chieh-Hsiung","family":"Kuan","sequence":"additional","affiliation":[{"name":"Graduate Institute of Electronics Engineering, National Taiwan University, Taipei, Taiwan"}]}],"member":"320","published-online":{"date-parts":[[2019,4,13]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.117237"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.2433034"},{"key":"e_1_3_2_1_3_1","volume-title":"Appl. Phys","author":"Saitoh Yu","year":"2010","unstructured":"Yu Saitoh , Kazuhide Sumiyoshi and Takao Nakamur , Appl. Phys . Express 3-081001( 2010 ). Yu Saitoh, Kazuhide Sumiyoshi and Takao Nakamur, Appl. Phys. Express 3-081001(2010)."},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2271954"},{"key":"e_1_3_2_1_5_1","first-page":"302","volume":"31","author":"Piner Bin","year":"2010","unstructured":"Bin Lu; Edwin L. Piner and Tom\u00e1s Palacios , IEEE Electr . device Lett. 31 , ( 2010 ), 302 -- 304 . Bin Lu; Edwin L. Piner and Tom\u00e1s Palacios, IEEE Electr. device Lett. 31, (2010), 302--304.","journal-title":"Lett."},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1143\/APEX.3.101003"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.3569594"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.4941814"},{"key":"e_1_3_2_1_9_1","first-page":"11","volume":"32","author":"Lee Geng-Yen","year":"2011","unstructured":"Geng-Yen Lee , Hsueh-Hsing Liu , and Jen-Inn Chyi , IEEE Electr . device Lett. 32 , ( Nov. 2011 ), 11 . Geng-Yen Lee, Hsueh-Hsing Liu, and Jen-Inn Chyi, IEEE Electr. device Lett. 32, (Nov. 2011), 11.","journal-title":"Lett."},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.3304004"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1143\/JJAP.49.042102"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2014.03.050"},{"key":"e_1_3_2_1_13_1","first-page":"8","volume":"31","author":"Kim Sang-Mook","year":"2010","unstructured":"Sang-Mook Kim , Hwa Sub Oh and Jung-Hoon Song , IEEE Electr . device Lett. 31 , ( Aug. 2010 ), 8 . Sang-Mook Kim, Hwa Sub Oh and Jung-Hoon Song, IEEE Electr. device Lett. 31, (Aug. 2010), 8.","journal-title":"Lett."},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1038\/srep45519"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1002\/pssc.201510196"}],"event":{"name":"ICECC 2019: 2019 The 2nd International Conference on Electronics, Communications and Control Engineering","acronym":"ICECC 2019","location":"Phuket Thailand"},"container-title":["Proceedings of the 2019 2nd International Conference on Electronics, Communications and Control Engineering"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3324033.3324038","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,15]],"date-time":"2023-08-15T16:17:01Z","timestamp":1692116221000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3324033.3324038"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,4,13]]},"references-count":15,"alternative-id":["10.1145\/3324033.3324038","10.1145\/3324033"],"URL":"https:\/\/doi.org\/10.1145\/3324033.3324038","relation":{},"subject":[],"published":{"date-parts":[[2019,4,13]]},"assertion":[{"value":"2019-04-13","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}