{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T09:10:44Z","timestamp":1725613844734},"publisher-location":"New York, NY, USA","reference-count":18,"publisher":"ACM","content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2000,5]]},"DOI":"10.1145\/332357.332390","type":"proceedings-article","created":{"date-parts":[[2004,2,3]],"date-time":"2004-02-03T19:19:02Z","timestamp":1075835942000},"page":"140-146","update-policy":"http:\/\/dx.doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Critical area computation for missing material defects in VLSI circuits"],"prefix":"10.1145","author":[{"given":"Evanthia","family":"Papadopoulou","sequence":"first","affiliation":[{"name":"IBM TJ Watson Research Center, Yorktown Heights, NY"}]}],"member":"320","published-online":{"date-parts":[[2000,5]]},"reference":[{"key":"e_1_3_2_1_1_2","doi-asserted-by":"publisher","DOI":"10.1145\/116873.116880"},{"key":"e_1_3_2_1_2_2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1985.1052404"},{"key":"e_1_3_2_1_3_2","unstructured":"I. Koren \"The effect of scaling on the yield of VLSI circuits\" Yield Modeling and defect Tolerance in VLSI circuits W.R. Moore W. Maly and A. Strojwas Eds. Bristol UK: Adam-Hilger Ltd. 91-99 1988.]] I. Koren \"The effect of scaling on the yield of VLSI circuits\" Yield Modeling and defect Tolerance in VLSI circuits W.R. Moore W. Maly and A. Strojwas Eds. Bristol UK: Adam-Hilger Ltd. 91-99 1988.]]"},{"key":"e_1_3_2_1_4_2","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.1982.4767267"},{"key":"e_1_3_2_1_5_2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1985.1270112"},{"volume-title":"Proc. IEEE, 356-392","author":"Maly W.","key":"e_1_3_2_1_6_2"},{"key":"e_1_3_2_1_7_2","doi-asserted-by":"publisher","DOI":"10.1049\/el:19830156"},{"key":"e_1_3_2_1_8_2","doi-asserted-by":"publisher","DOI":"10.1109\/43.743724"},{"key":"e_1_3_2_1_10_2","unstructured":"Niagara: IBM Internal DRC and Shape Processing Tool.]] Niagara: IBM Internal DRC and Shape Processing Tool.]]"},{"key":"e_1_3_2_1_11_2","doi-asserted-by":"publisher","DOI":"10.1109\/43.752929"},{"key":"e_1_3_2_1_12_2","first-page":"9","volume-title":"9th International Symposium on Algorithms and Computation, LNCS 1533","author":"Papadopoulou E.","year":"1998"},{"key":"e_1_3_2_1_13_2","doi-asserted-by":"publisher","DOI":"10.1109\/43.127625"},{"key":"e_1_3_2_1_14_2","doi-asserted-by":"crossref","unstructured":"Preparata F. P. and M. I. Shamos Computational Geometry: an Introduction Springer-Verlag New York NY 1985.]] Preparata F. P. and M. I. Shamos Computational Geometry: an Introduction Springer-Verlag New York NY 1985.]]","DOI":"10.1007\/978-1-4612-1098-6"},{"volume-title":"Technical Report","year":"1995","author":"Rogenski J. S.","key":"e_1_3_2_1_15_2"},{"key":"e_1_3_2_1_16_2","doi-asserted-by":"publisher","DOI":"10.1109\/66.388016"},{"key":"e_1_3_2_1_17_2","doi-asserted-by":"publisher","DOI":"10.1147\/rd.284.0461"},{"key":"e_1_3_2_1_18_2","doi-asserted-by":"publisher","DOI":"10.1109\/66.382276"},{"key":"e_1_3_2_1_19_2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1986.1270225"}],"event":{"name":"ISPD00: International Symposium on Physical Design 2000","sponsor":["SIGDA ACM Special Interest Group on Design Automation"],"location":"San Diego California USA","acronym":"ISPD00"},"container-title":["Proceedings of the 2000 international symposium on Physical design"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/332357.332390","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,1,7]],"date-time":"2023-01-07T02:58:36Z","timestamp":1673060316000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/332357.332390"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2000,5]]},"references-count":18,"alternative-id":["10.1145\/332357.332390","10.1145\/332357"],"URL":"https:\/\/doi.org\/10.1145\/332357.332390","relation":{},"subject":[],"published":{"date-parts":[[2000,5]]},"assertion":[{"value":"2000-05-01","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}