{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T20:44:26Z","timestamp":1730321066164,"version":"3.28.0"},"publisher-location":"New York, NY, USA","reference-count":24,"publisher":"ACM","license":[{"start":{"date-parts":[[2019,6,2]],"date-time":"2019-06-02T00:00:00Z","timestamp":1559433600000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2019,6,2]]},"DOI":"10.1145\/3316781.3317758","type":"proceedings-article","created":{"date-parts":[[2019,5,23]],"date-time":"2019-05-23T18:07:13Z","timestamp":1558634833000},"page":"1-6","update-policy":"http:\/\/dx.doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":4,"title":["Accurate Estimation of Program Error Rate for Timing-Speculative Processors"],"prefix":"10.1145","author":[{"given":"Omid","family":"Assare","sequence":"first","affiliation":[{"name":"University of California, San Diego, Department of Computer Science and Engineering, La Jolla, CA, USA"}]},{"given":"Rajesh","family":"Gupta","sequence":"additional","affiliation":[{"name":"University of California, San Diego, Department of Computer Science and Engineering, La Jolla, CA, USA"}]}],"member":"320","published-online":{"date-parts":[[2019,6,2]]},"reference":[{"key":"e_1_3_2_1_1_1","doi-asserted-by":"publisher","DOI":"10.1214\/ss\/1177012015"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1145\/2656075.2656101"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2016.7753344"},{"issue":"1","key":"e_1_3_2_1_4_1","first-page":"194","article-title":"A 45 nm resilient microprocessor core for dynamic variation tolerance. Solid-State Circuits","volume":"46","author":"Bowman K.","year":"2011","journal-title":"IEEE Journal of"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1214\/aop\/1176996359"},{"key":"e_1_3_2_1_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2016.64"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.5555\/3199700.3199778"},{"first-page":"381","volume-title":"Automation Test in Europe Conference Exhibition (DATE)","year":"2015","author":"Constantin J.","key":"e_1_3_2_1_8_1"},{"issue":"1","key":"e_1_3_2_1_9_1","first-page":"32","article-title":"Razorii: In situ error detection and correction for pvt and ser tolerance. Solid-State Circuits","volume":"44","author":"Das S.","year":"2009","journal-title":"IEEE Journal of"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1145\/2213977.2214042"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2004.85"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1145\/3195970.3196013"},{"key":"e_1_3_2_1_13_1","unstructured":"A. Gaisler. Tsim erc32\/leon simulator. A. Gaisler. Tsim erc32\/leon simulator."},{"volume-title":"International statistical review, 70(3):419--435","year":"2002","author":"Gibbs A. L.","key":"e_1_3_2_1_14_1"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2009.4798256"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.5555\/1128020.1128563"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.csda.2012.10.006"},{"key":"e_1_3_2_1_18_1","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2017.2783333"},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.5555\/977395.977673"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.2140\/pjm.1960.10.1181"},{"key":"e_1_3_2_1_21_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.893544"},{"volume":"602","volume-title":"Proceedings of the Sixth Berkeley Symposium on Mathematical Statistics and Probability","year":"1972","author":"Stein C.","key":"e_1_3_2_1_22_1"},{"volume-title":"Depth first search and linear graph algorithms","year":"1972","series-title":"SIAM Journal on Computing","author":"Tarjan R.","key":"e_1_3_2_1_23_1"},{"key":"e_1_3_2_1_24_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2749423"}],"event":{"name":"DAC '19: The 56th Annual Design Automation Conference 2019","sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEEE-CEDA","SIGBED ACM Special Interest Group on Embedded Systems"],"location":"Las Vegas NV USA","acronym":"DAC '19"},"container-title":["Proceedings of the 56th Annual Design Automation Conference 2019"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/3316781.3317758","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,1,6]],"date-time":"2023-01-06T03:49:16Z","timestamp":1672976956000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/3316781.3317758"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6,2]]},"references-count":24,"alternative-id":["10.1145\/3316781.3317758","10.1145\/3316781"],"URL":"https:\/\/doi.org\/10.1145\/3316781.3317758","relation":{},"subject":[],"published":{"date-parts":[[2019,6,2]]},"assertion":[{"value":"2019-06-02","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}