{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T10:20:22Z","timestamp":1725618022439},"publisher-location":"New York, NY, USA","reference-count":13,"publisher":"ACM","license":[{"start":{"date-parts":[[2016,11,7]],"date-time":"2016-11-07T00:00:00Z","timestamp":1478476800000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/www.acm.org\/publications\/policies\/copyright_policy#Background"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,11,7]]},"DOI":"10.1145\/2966986.2967019","type":"proceedings-article","created":{"date-parts":[[2016,10,18]],"date-time":"2016-10-18T12:23:59Z","timestamp":1476793439000},"page":"1-8","source":"Crossref","is-referenced-by-count":7,"title":["Critical path isolation for time-to-failure extension and lower voltage operation"],"prefix":"10.1145","author":[{"given":"Yutaka","family":"Masuda","sequence":"first","affiliation":[{"name":"Osaka University"}]},{"given":"Masanori","family":"Hashimoto","sequence":"additional","affiliation":[{"name":"Osaka University"}]},{"given":"Takao","family":"Onoye","sequence":"additional","affiliation":[{"name":"Osaka University"}]}],"member":"320","published-online":{"date-parts":[[2016,11,7]]},"reference":[{"key":"e_1_3_2_1_1_1","first-page":"774","volume-title":"ISQED","author":"Zang B.","year":"2008"},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2593170"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1145\/1278480.1278573"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.896305"},{"key":"e_1_3_2_1_5_1","first-page":"107","volume-title":"ICCAD","author":"Iizuka S.","year":"2013"},{"volume-title":"ITC","year":"2015","author":"Iizuka S.","key":"e_1_3_2_1_6_1"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/WWC.2001.15"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.870912"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2089657"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2101089"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1109\/43.205010"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2281986"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDERC.2014.6948799"}],"event":{"name":"ICCAD '16: IEEE\/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN","sponsor":["SIGDA ACM Special Interest Group on Design Automation","IEEE CAS","IEEE CS","IEEE-EDS Electronic Devices Society"],"location":"Austin Texas","acronym":"ICCAD '16"},"container-title":["Proceedings of the 35th International Conference on Computer-Aided Design"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2966986.2967019","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,12,21]],"date-time":"2020-12-21T05:28:15Z","timestamp":1608528495000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2966986.2967019"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,11,7]]},"references-count":13,"alternative-id":["10.1145\/2966986.2967019","10.1145\/2966986"],"URL":"https:\/\/doi.org\/10.1145\/2966986.2967019","relation":{},"subject":[],"published":{"date-parts":[[2016,11,7]]}}}