{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,12]],"date-time":"2024-08-12T13:57:08Z","timestamp":1723471028330},"publisher-location":"New York, NY, USA","reference-count":19,"publisher":"ACM","content-domain":{"domain":["dl.acm.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2011,7,17]]},"DOI":"10.1145\/2001420.2001446","type":"proceedings-article","created":{"date-parts":[[2011,7,20]],"date-time":"2011-07-20T12:34:54Z","timestamp":1311165294000},"update-policy":"http:\/\/dx.doi.org\/10.1145\/crossmark-policy","source":"Crossref","is-referenced-by-count":67,"title":["On the influence of multiple faults on coverage-based fault localization"],"prefix":"10.1145","author":[{"given":"Nicholas","family":"DiGiuseppe","sequence":"first","affiliation":[{"name":"University of California"}]},{"given":"James A.","family":"Jones","sequence":"additional","affiliation":[{"name":"University of California"}]}],"member":"320","published-online":{"date-parts":[[2011,7,17]]},"reference":[{"key":"e_1_3_2_1_1_1","volume-title":"Testing: Academic and Industrial Conference, Practice and Research Techniques","author":"Abreu R.","year":"2007","unstructured":"R. Abreu , P. Zoeteweij , and A. J. C. van Gemund . On the accuracy of spectrum-based fault localization . In Testing: Academic and Industrial Conference, Practice and Research Techniques , Windsor, UK , September 2007 . R. Abreu, P. Zoeteweij, and A. J. C. van Gemund. On the accuracy of spectrum-based fault localization. In Testing: Academic and Industrial Conference, Practice and Research Techniques, Windsor, UK, September 2007."},{"key":"e_1_3_2_1_2_1","doi-asserted-by":"publisher","DOI":"10.1145\/1806799.1806840"},{"key":"e_1_3_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1145\/1806799.1806839"},{"key":"e_1_3_2_1_4_1","doi-asserted-by":"publisher","DOI":"10.1145\/1062455.1062522"},{"key":"e_1_3_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2009.14"},{"key":"e_1_3_2_1_7_1","doi-asserted-by":"publisher","DOI":"10.5555\/1018434.1021566"},{"key":"e_1_3_2_1_8_1","doi-asserted-by":"publisher","DOI":"10.1145\/1101908.1101949"},{"key":"e_1_3_2_1_9_1","doi-asserted-by":"publisher","DOI":"10.1145\/581339.581397"},{"key":"e_1_3_2_1_10_1","doi-asserted-by":"publisher","DOI":"10.1145\/1273463.1273468"},{"key":"e_1_3_2_1_11_1","doi-asserted-by":"publisher","DOI":"10.1145\/1065010.1065014"},{"key":"e_1_3_2_1_12_1","doi-asserted-by":"publisher","DOI":"10.1145\/1181775.1181782"},{"key":"e_1_3_2_1_13_1","doi-asserted-by":"publisher","DOI":"10.1145\/1081706.1081753"},{"key":"e_1_3_2_1_14_1","doi-asserted-by":"publisher","DOI":"10.1145\/227607.227610"},{"key":"e_1_3_2_1_15_1","doi-asserted-by":"publisher","DOI":"10.5555\/776816.776872"},{"key":"e_1_3_2_1_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2003.1240292"},{"key":"e_1_3_2_1_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCRD.2010.14"},{"key":"e_1_3_2_1_18_1","volume-title":"International Journal of Man-Machine Studies: A process analysis, 23(5):459--494","author":"Vessey I.","year":"1985","unstructured":"I. Vessey . Expertise in debugging computer programs . International Journal of Man-Machine Studies: A process analysis, 23(5):459--494 , 1985 . I. Vessey. Expertise in debugging computer programs. International Journal of Man-Machine Studies: A process analysis, 23(5):459--494, 1985."},{"key":"e_1_3_2_1_19_1","doi-asserted-by":"publisher","DOI":"10.1145\/1368088.1368100"},{"key":"e_1_3_2_1_20_1","doi-asserted-by":"publisher","DOI":"10.1145\/1143844.1143983"}],"event":{"name":"ISSTA '11: International Symposium on Software Testing and Analysis","location":"Toronto Ontario Canada","acronym":"ISSTA '11","sponsor":["SIGSOFT ACM Special Interest Group on Software Engineering","SIGPLAN ACM Special Interest Group on Programming Languages"]},"container-title":["Proceedings of the 2011 International Symposium on Software Testing and Analysis"],"original-title":[],"link":[{"URL":"https:\/\/dl.acm.org\/doi\/pdf\/10.1145\/2001420.2001446","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,1,8]],"date-time":"2023-01-08T18:23:00Z","timestamp":1673202180000},"score":1,"resource":{"primary":{"URL":"https:\/\/dl.acm.org\/doi\/10.1145\/2001420.2001446"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,7,17]]},"references-count":19,"alternative-id":["10.1145\/2001420.2001446","10.1145\/2001420"],"URL":"https:\/\/doi.org\/10.1145\/2001420.2001446","relation":{},"subject":[],"published":{"date-parts":[[2011,7,17]]},"assertion":[{"value":"2011-07-17","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}