{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,2]],"date-time":"2022-04-02T11:54:08Z","timestamp":1648900448603},"reference-count":3,"publisher":"World Scientific Pub Co Pte Lt","issue":"01","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J CIRCUIT SYST COMP"],"published-print":{"date-parts":[[2012,2]]},"abstract":" Fault tolerance and energy have become important design issues in multiprocessor system-on-chips (SoCs) with the technology scaling and the proliferation of battery-powered multiprocessor SoCs. This paper proposed an energy-efficient fault tolerance task allocation scheme for multiprocessor SoCs in real-time energy harvesting systems. The proposed fault-tolerance scheme is based on the principle of the primiary\/backup task scheduling, and can tolerate at most one single transient fault. Extensive simulated experiment shows that the proposed scheme can save up to 30% energy consumption and reduce the miss ratio to about 8% in the presence of faults. <\/jats:p>","DOI":"10.1142\/s0218126612500041","type":"journal-article","created":{"date-parts":[[2012,3,8]],"date-time":"2012-03-08T10:51:29Z","timestamp":1331203889000},"page":"1250004","source":"Crossref","is-referenced-by-count":5,"title":["ADAPTIVE FAULT-TOLERANT TASK SCHEDULING FOR REAL-TIME ENERGY HARVESTING SYSTEMS"],"prefix":"10.1142","volume":"21","author":[{"given":"LINJIE","family":"ZHU","sequence":"first","affiliation":[{"name":"Department of Computer Science and Technology, East China Normal University, Shanghai 200241, China"}]},{"given":"TONGQUAN","family":"WEI","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Technology, East China Normal University, Shanghai 200241, China"}]},{"given":"XIAODAO","family":"CHEN","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Michigan Technological University, Houghton, MI 49931, USA"}]},{"given":"YONGHE","family":"GUO","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Michigan Technological University, Houghton, MI 49931, USA"}]},{"given":"SHIYAN","family":"HU","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Michigan Technological University, Houghton, MI 49931, USA"}]}],"member":"219","published-online":{"date-parts":[[2012,4,7]]},"reference":[{"key":"p_12","first-page":"634","volume":"50","author":"Reed R.","year":"2006","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"p_13","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2006.880947"},{"key":"p_14","first-page":"101","author":"Langley T.","year":"2003","journal-title":"IEEE Radiation Effects Data Workshop"}],"container-title":["Journal of Circuits, Systems and Computers"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.worldscientific.com\/doi\/pdf\/10.1142\/S0218126612500041","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,7]],"date-time":"2019-08-07T05:01:10Z","timestamp":1565154070000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.worldscientific.com\/doi\/abs\/10.1142\/S0218126612500041"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,2]]},"references-count":3,"journal-issue":{"issue":"01","published-online":{"date-parts":[[2012,4,7]]},"published-print":{"date-parts":[[2012,2]]}},"alternative-id":["10.1142\/S0218126612500041"],"URL":"https:\/\/doi.org\/10.1142\/s0218126612500041","relation":{},"ISSN":["0218-1266","1793-6454"],"issn-type":[{"value":"0218-1266","type":"print"},{"value":"1793-6454","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,2]]}}}