{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T15:47:48Z","timestamp":1730303268144,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,1]]},"DOI":"10.1109\/vlsid.2019.00038","type":"proceedings-article","created":{"date-parts":[[2019,5,13]],"date-time":"2019-05-13T19:07:43Z","timestamp":1557774463000},"page":"112-117","source":"Crossref","is-referenced-by-count":1,"title":["RSBST: A Rapid Software-Based Self-Test Methodology for Processor Testing"],"prefix":"10.1109","author":[{"given":"M.S.","family":"Vasudevan","sequence":"first","affiliation":[]},{"given":"Santosh","family":"Biswas","sequence":"additional","affiliation":[]},{"given":"Aryabartta","family":"Sahu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s10710-005-2985-x"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s10766-005-0005-7"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEVC.2005.856207"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2538800"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-018-5709-x"},{"key":"ref15","first-page":"1124","article-title":"A Synthesis-Agnostic Behavioral Fault Model for High Gate-Level Fault Coverage","author":"anton karputkin","year":"2016","journal-title":"Design Automation Test in Europe Conference Exhibition (DATE)"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/HLDVT.2000.889551"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2005.1594451"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/MP.2003.1180938"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1023\/A:1025178014797"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/43.913755"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2003.1219068"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.5"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2005.68"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-014-5457-5"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2000866"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2001.915006"},{"key":"ref1","volume":"28","author":"gizopoulos","year":"2013","journal-title":"Embedded Processor-Based Self-Test"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.1277902"}],"event":{"name":"2019 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems (VLSID)","start":{"date-parts":[[2019,1,5]]},"location":"Delhi, NCR, India","end":{"date-parts":[[2019,1,9]]}},"container-title":["2019 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems (VLSID)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8698529\/8710751\/08711286.pdf?arnumber=8711286","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,18]],"date-time":"2022-07-18T10:44:12Z","timestamp":1658141052000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8711286\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,1]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/vlsid.2019.00038","relation":{},"subject":[],"published":{"date-parts":[[2019,1]]}}}