{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,9,22]],"date-time":"2022-09-22T20:55:25Z","timestamp":1663880125594},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2014,2,1]],"date-time":"2014-02-01T00:00:00Z","timestamp":1391212800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2014,2]]},"DOI":"10.1109\/tvlsi.2013.2242909","type":"journal-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T04:36:36Z","timestamp":1361248596000},"page":"334-342","source":"Crossref","is-referenced-by-count":7,"title":["Time-Based All-Digital Technique for Analog Built-in Self-Test"],"prefix":"10.1109","volume":"22","author":[{"given":"Rajath","family":"Vasudevamurthy","sequence":"first","affiliation":[]},{"given":"Pratap Kumar","family":"Das","sequence":"additional","affiliation":[]},{"given":"Bharadwaj","family":"Amrutur","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2009.2020947"},{"key":"ref11","first-page":"120","article-title":"An all-digital analog-to-digital converter with 12 $\\mu{\\rm V}$<\/tex><\/formula>\/LSB using moving-average filtering","volume":"38","author":"watanabe","year":"2004","journal-title":"IEEE Trans Circuits Syst II Exp Briefs"},{"key":"ref12","author":"bergs","year":"2010","journal-title":"Design of A VCO Based ADC in A 180 Nm CMOS Process for Use in Positron Emission Tomography"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.917500"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.836353"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2011.5937996"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2008.4708812"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2006.1693099"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2010.5433996"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2108132"},{"key":"ref4","first-page":"138","article-title":"Applications of on-chip samplers for test and measurement of integrated circuits","author":"ho","year":"1998","journal-title":"Symp VLSI Circuits Dig Tech Papers"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2003.812313"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/82.728852"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/19.106284"},{"key":"ref8","first-page":"246","article-title":"A 9.4-ENOB 1 V 3.8 $\\mu{\\rm W}$<\/tex><\/formula> 100 kS\/s SAR ADC with time domain comparator","author":"agnes","year":"2008","journal-title":"IEEE Int Solid-State Circuits Conf Dig Tech Papers"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.836345"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/1840845.1840899"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2159055"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2102590"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2083706"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2008.2010144"},{"key":"ref21","author":"baker","year":"2002","journal-title":"CMOS Mixed-Signal Circuit Design"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1984.1052232"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/6716075\/06464607.pdf?arnumber=6464607","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:31:42Z","timestamp":1642005102000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6464607\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,2]]},"references-count":23,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2013.2242909","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,2]]}}}