{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,30]],"date-time":"2022-03-30T14:17:57Z","timestamp":1648649877500},"reference-count":15,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2013,4,1]],"date-time":"2013-04-01T00:00:00Z","timestamp":1364774400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2013,4]]},"DOI":"10.1109\/tvlsi.2012.2192458","type":"journal-article","created":{"date-parts":[[2012,5,10]],"date-time":"2012-05-10T18:59:27Z","timestamp":1336676367000},"page":"781-785","source":"Crossref","is-referenced-by-count":12,"title":["Supply Noise Suppression by Triple-Well Structure"],"prefix":"10.1109","volume":"21","author":[{"given":"Yasuhiro","family":"Ogasahara","sequence":"first","affiliation":[]},{"given":"Masanori","family":"Hashimoto","sequence":"additional","affiliation":[]},{"given":"Toshiki","family":"Kanamoto","sequence":"additional","affiliation":[]},{"given":"Takao","family":"Onoye","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1995.518150"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2020192"},{"key":"ref12","year":"2006","journal-title":"HSPICE Simulation and Analysis User Guide"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2007.901574"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2002.1043335"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/369691.369737"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/SOCC.2006.283901"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2003.1198681"},{"key":"ref6","first-page":"397","article-title":"Measurement of supply noise suppression by substrate and deep N-well in 90 nm process","author":"ogasahara","year":"2008","journal-title":"Proc IEEE Solid-State Circuits Conf"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.845559"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2001.979559"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.803949"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2001.968729"},{"key":"ref1","first-page":"651","article-title":"Challenges in power-ground integrity","author":"lin","year":"2001","journal-title":"Proc IEEE Comput Aided Design Int Conf"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.1984.1270066"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/92\/6481519\/06195030.pdf?arnumber=6195030","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:56:14Z","timestamp":1638219374000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6195030\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,4]]},"references-count":15,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2012.2192458","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,4]]}}}