{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,7,6]],"date-time":"2024-07-06T04:36:01Z","timestamp":1720240561327},"reference-count":13,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2011,12,1]],"date-time":"2011-12-01T00:00:00Z","timestamp":1322697600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2011,12]]},"DOI":"10.1109\/tvlsi.2010.2083706","type":"journal-article","created":{"date-parts":[[2010,11,18]],"date-time":"2010-11-18T21:12:19Z","timestamp":1290114739000},"page":"2267-2275","source":"Crossref","is-referenced-by-count":15,"title":["0.84 ps Resolution Clock Skew Measurement via Subsampling"],"prefix":"10.1109","volume":"19","author":[{"given":"Bharadwaj","family":"Amrutur","sequence":"first","affiliation":[]},{"given":"Pratap Kumar","family":"Das","sequence":"additional","affiliation":[]},{"given":"Rajath","family":"Vasudevamurthy","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2000.839735"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2010.5433996"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2008.4708812"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevE.52.4691"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2004.1332740"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt:20060111"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2007.4405703"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2003.820531"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.859883"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1984.1052232"},{"key":"ref2","first-page":"52","article-title":"On-chip pico second time measurement","author":"gutnik","year":"2000","journal-title":"Proc Symp VLSI Circuits Dig Tech Papers"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.917405"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.1994.344727"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/92\/6059694\/05634156.pdf?arnumber=5634156","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T00:43:32Z","timestamp":1633913012000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5634156\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,12]]},"references-count":13,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2010.2083706","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,12]]}}}