乐胖代购免代理版

{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,20]],"date-time":"2024-09-20T16:55:31Z","timestamp":1726851331969},"reference-count":65,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2023,6,1]],"date-time":"2023-06-01T00:00:00Z","timestamp":1685577600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,6,1]],"date-time":"2023-06-01T00:00:00Z","timestamp":1685577600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,6,1]],"date-time":"2023-06-01T00:00:00Z","timestamp":1685577600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51835001"],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2023,6]]},"DOI":"10.1109\/tr.2022.3194057","type":"journal-article","created":{"date-parts":[[2022,8,10]],"date-time":"2022-08-10T19:28:05Z","timestamp":1660159685000},"page":"552-573","source":"Crossref","is-referenced-by-count":18,"title":["Failure Mode and Effect Analysis Using T-Spherical Fuzzy Maximizing Deviation and Combined Comparison Solution Methods"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"http:\/\/orcid.org\/0000-0002-4971-1466","authenticated-orcid":false,"given":"Guangquan","family":"Huang","sequence":"first","affiliation":[{"name":"College of Mechanical and Vehicle Engineering, Chongqing University, Chongqing, China"}]},{"ORCID":"http:\/\/orcid.org\/0000-0001-7542-3321","authenticated-orcid":false,"given":"Liming","family":"Xiao","sequence":"additional","affiliation":[{"name":"College of Mechanical and Vehicle Engineering, Chongqing University, Chongqing, China"}]},{"ORCID":"http:\/\/orcid.org\/0000-0002-9335-9930","authenticated-orcid":false,"given":"Witold","family":"Pedrycz","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Alberta, Edmonton, AB, Canada"}]},{"given":"Genbao","family":"Zhang","sequence":"additional","affiliation":[{"name":"College of Mechanical and Vehicle Engineering, Chongqing University, Chongqing, China"}]},{"ORCID":"http:\/\/orcid.org\/0000-0003-4245-8813","authenticated-orcid":false,"given":"Luis","family":"Martinez","sequence":"additional","affiliation":[{"name":"Department of Computer Science, University of Jaén, Jaén, Spain"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2866029"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2019.06.055"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.15388\/20-INFOR439"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2020.107425"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2020.106834"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1007\/s40815-020-00820-1"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2019.104873"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.3390\/math9182328"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1007\/s00500-021-05786-2"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2019.2955500"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s00500-021-05605-8"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1002\/qre.2714"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2017.2754642"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1007\/s00500-018-3480-7"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3233\/JIFS-182541"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-020-05350-3"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-018-3521-2"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s00500-018-03706-5"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1007\/s10462-021-09959-1"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2022.06.061"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2021.106793"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1002\/qre.3062"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.15837\/ijccc.2019.5.3558"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1007\/s44196-021-00038-5"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1080\/24725854.2020.1731774"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2020.2986986"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2016.08.043"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2021.3060029"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2021.104392"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2018.06.015"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s10726-021-09756-9"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2869787"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2020.2973403"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s00500-020-05497-0"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2019.2938151"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijpe.2017.03.008"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2018.2851258"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2015.04.036"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-014-1647-4"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2015.2478150"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/s11063-017-9597-3"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2018.11.014"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.dt.2019.11.007"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.jclepro.2020.123351"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1108\/MD-05-2017-0458"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s40815-021-01056-3"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2019.2955916"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2016.2540059"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2420300"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2021.107821"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1080\/01605682.2021.2020694"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.jclepro.2019.117936"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2015.2413894"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1002\/acm2.12205"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2021.101309"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2014.2315654"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.scs.2019.101529"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2020.2973431"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2022.04.040"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2017.2778316"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1002\/qre.2268"},{"key":"ref29","first-page":"21","article-title":"Using the method of maximizing deviations to make decision for multi-indices","volume":"8","author":"wang","year":"1997","journal-title":"J Syst Eng Electron"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.3233\/JIFS-181401"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2006.07.004"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2019.06.003"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/10142050\/09854190.pdf?arnumber=9854190","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,19]],"date-time":"2023-06-19T17:57:51Z","timestamp":1687197471000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9854190\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,6]]},"references-count":65,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tr.2022.3194057","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,6]]}}}