{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T04:07:44Z","timestamp":1743480464036,"version":"3.40.3"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2003,12,1]],"date-time":"2003-12-01T00:00:00Z","timestamp":1070236800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2003,12]]},"DOI":"10.1109\/tr.2003.821933","type":"journal-article","created":{"date-parts":[[2004,1,22]],"date-time":"2004-01-22T20:17:06Z","timestamp":1074802626000},"page":"444-457","source":"Crossref","is-referenced-by-count":5,"title":["Analysis and application of digital spectral warping in analog and mixed-signal testing"],"prefix":"10.1109","volume":"52","author":[{"given":"W.P.M.","family":"Allen","sequence":"first","affiliation":[]},{"given":"D.G.","family":"Bailey","sequence":"additional","affiliation":[]},{"given":"S.N.","family":"Demidenko","sequence":"additional","affiliation":[]},{"given":"V.","family":"Piuri","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"article-title":"Mixed-signal fault models and design for test (I)","volume-title":"Proc. IEEE Asian Test Symp.","author":"Soma","key":"ref1"},{"article-title":"Mixed-signal fault models and design for test (II)","volume-title":"Proc. IEEE Asian Test Symp.","author":"Wey","key":"ref2"},{"issue":"1\/2","key":"ref3","article-title":"Special issue on analog and mixed signal testing","volume":"9","year":"1996"},{"issue":"5","key":"ref4","article-title":"Special issue on the IEEE international mixed signal testing workshop (IMSTW)","volume-title":"J. Electronic Testing: Theory and Applications (JETTA)","volume":"17"},{"key":"ref5","article-title":"Analog and mixed-signal boundary-scan: A guide to the IEEE 1149.4 test standard","volume-title":"Kluwer Academic Publishers","volume":"16","author":"Osserian","year":"1999"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/b117406"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-2341-3"},{"volume-title":"DSP-Based Testing of Analog and Mixed-Signal Circuits","year":"1987","author":"Mahoney","key":"ref8"},{"volume-title":"A Simple Approach to Digital Signal Processing","year":"1996","author":"Marven","key":"ref9"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1971.8146"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1972.8727"},{"key":"ref12","first-page":"397","article-title":"Analysis of the frequency characteristics of a digital spectral warping network","volume-title":"Proc. Int. Workshop on Design Methodologies for Microelectronics and Signal Processing","author":"Demidenko"},{"key":"ref13","first-page":"55","article-title":"A new time-saving method for ADC testing","volume-title":"Proc. Measurement \u201999 Conf.","author":"Holub"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1049\/cp:19990472"},{"key":"ref16","first-page":"443","volume-title":"Digital Signal Processing: A Computer-Based Approach","author":"Mitra","year":"1998"},{"key":"ref17","first-page":"492","article-title":"Analysis and implementation of a spectral warping network","volume-title":"Proc. Int. Symp. Integrated Circuits","author":"Allen"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/24\/28169\/01260595.pdf?arnumber=1260595","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,31]],"date-time":"2025-03-31T16:30:15Z","timestamp":1743438615000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1260595\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003,12]]},"references-count":16,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2003,12]]}},"URL":"https:\/\/doi.org\/10.1109\/tr.2003.821933","relation":{},"ISSN":["0018-9529"],"issn-type":[{"type":"print","value":"0018-9529"}],"subject":[],"published":{"date-parts":[[2003,12]]}}}