{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,16]],"date-time":"2024-08-16T06:32:17Z","timestamp":1723789937419},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2017,3,1]],"date-time":"2017-03-01T00:00:00Z","timestamp":1488326400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"US National Science Foundation","award":["0953005","1421855","1422709"]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Parallel Distrib. Syst."],"published-print":{"date-parts":[[2017,3,1]]},"DOI":"10.1109\/tpds.2016.2600595","type":"journal-article","created":{"date-parts":[[2016,8,16]],"date-time":"2016-08-16T18:39:24Z","timestamp":1471372764000},"page":"813-825","source":"Crossref","is-referenced-by-count":104,"title":["On Reliability Management of Energy-Aware Real-Time Systems Through Task Replication"],"prefix":"10.1109","volume":"28","author":[{"given":"Mohammad A.","family":"Haque","sequence":"first","affiliation":[]},{"given":"Hakan","family":"Aydin","sequence":"additional","affiliation":[]},{"given":"Dakai","family":"Zhu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","first-page":"161","article-title":"Reliability enhancement of real-time multiprocessor systems through dynamic reconfiguration","author":"yu","year":"0","journal-title":"Proc IEEE Workshop Fault-Tolerant Parallel Distrib Syst"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-45591-4_177"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1137\/0203025"},{"key":"ref32","author":"garey","year":"1979","journal-title":"Computers and Intractability"},{"key":"ref31","year":"2004","journal-title":"Intel Intel Pentium M Processor Datasheet"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2596684"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/71.735960"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/71.584093"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/IPPS.1994.288216"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/s11241-005-0507-9"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2255624"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpdc.2004.03.015"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2005.37"},{"key":"ref12","first-page":"1","article-title":"Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales","author":"ebrahimi","year":"0","journal-title":"Proc IEEE Design Automation and Test Europe Conf and Exhibition"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2012.2218128"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-23389-5_1"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-585-29603-6_17"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2004.1275298"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2004.85"},{"key":"ref18","first-page":"35","article-title":"The effects of energy management on reliability in real-time embedded systems","author":"zhu","year":"0","journal-title":"Proc IEEE Int Conf Comput Aided Des"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/1687399.1687412"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2003.1253723"},{"key":"ref4","first-page":"124","article-title":"Towards energy-aware software-based fault tolerance in real-time systems","author":"unsal","year":"0","journal-title":"Proc IEEE Int Symp Low Power Electron Des"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065744"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2004.1261830"},{"key":"ref6","author":"koren","year":"2010","journal-title":"Fault-Tolerant Systems"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/s11241-014-9210-z"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/993396.993402"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1982.1676063"},{"key":"ref7","author":"pradhan","year":"1996","journal-title":"Fault Tolerant Computer System Design"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2011.6081396"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/6420.6422"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2173488"},{"key":"ref20","doi-asserted-by":"crossref","first-page":"1382","DOI":"10.1109\/TC.2009.56","article-title":"Reliability-aware energy management for periodic real-time tasks","volume":"58","author":"zhu","year":"2009","journal-title":"IEEE Trans Comput"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/IGCC.2013.6604518"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/RTAS.2012.30"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837480"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/RTSS.2008.37"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/321738.321743"},{"key":"ref26","doi-asserted-by":"crossref","first-page":"78","DOI":"10.1145\/1013235.1013261","article-title":"Dynamic Voltage Scaling for Systemwide Energy Minimization in Real-Time Embedded Systems","author":"jejurikar","year":"2004","journal-title":"Proceedings of the 2004 International Symposium on Low Power Electronics and Design LPE"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-28641-7_12"}],"container-title":["IEEE Transactions on Parallel and Distributed Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/71\/7851095\/07544521.pdf?arnumber=7544521","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,6]],"date-time":"2022-07-06T02:40:25Z","timestamp":1657075225000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7544521\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,3,1]]},"references-count":41,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tpds.2016.2600595","relation":{},"ISSN":["1045-9219"],"issn-type":[{"value":"1045-9219","type":"print"}],"subject":[],"published":{"date-parts":[[2017,3,1]]}}}