{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,5]],"date-time":"2024-10-05T04:21:16Z","timestamp":1728102076457},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100009994","name":"Excellent Youth Foundation of Henan Scientific Committee","doi-asserted-by":"publisher","award":["222300420019"],"id":[{"id":"10.13039\/501100009994","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61973278"],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100013066","name":"Basic Research Projects of Key Scientific Research Projects of Colleges and Universities in Henan Province","doi-asserted-by":"publisher","award":["21zx007"],"id":[{"id":"10.13039\/501100013066","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tim.2024.3460886","type":"journal-article","created":{"date-parts":[[2024,9,17]],"date-time":"2024-09-17T18:49:40Z","timestamp":1726598980000},"page":"1-11","source":"Crossref","is-referenced-by-count":0,"title":["Fault Diagnosis for Permanent Magnet Synchronous Motor With Demagnetization Fault and Sensor Fault"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"http:\/\/orcid.org\/0000-0001-7209-8383","authenticated-orcid":false,"given":"Yunfeng","family":"Kang","sequence":"first","affiliation":[{"name":"School of Electrical and Information Engineering, Zhengzhou University, Zhengzhou, China"}]},{"ORCID":"http:\/\/orcid.org\/0000-0003-2235-7556","authenticated-orcid":false,"given":"Lina","family":"Yao","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Zhengzhou University, Zhengzhou, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2524415"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MIAS.2016.2600739"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3317862"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2020.06.010"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2023.3304173"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2784348"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2941255"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.01.076"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3294603"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3050360"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3265326"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2530046"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3265969"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2928008"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2967053"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3051140"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/9.0000494"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3192683"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2019.2942520"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2992977"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3109093"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3305653"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3370988"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3225048"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3106655"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/9.50357"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2918062"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10367905\/10682522.pdf?arnumber=10682522","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,4]],"date-time":"2024-10-04T17:35:16Z","timestamp":1728063316000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10682522\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/tim.2024.3460886","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2024]]}}}