{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:09:35Z","timestamp":1740132575670,"version":"3.37.3"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development (R&D) Program of China","doi-asserted-by":"publisher","award":["2021YFB3203200"],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51890884","51975466"],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Chongqing Natural Science Basic Research Project","award":["cstc2021jcyj-msxmX0801"]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3216401","type":"journal-article","created":{"date-parts":[[2022,11,3]],"date-time":"2022-11-03T22:00:06Z","timestamp":1667512806000},"page":"1-9","source":"Crossref","is-referenced-by-count":4,"title":["A Ferromagnetic Particle Sensor Based on a Honeycomb Permanent Magnet for High Precision and High Throughput"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8968-790X","authenticated-orcid":false,"given":"Zheng","family":"Yuan","sequence":"first","affiliation":[{"name":"State Key Laboratory for Manufacturing Systems Engineering, International Joint Laboratory for Micro\/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Yantai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9347-5165","authenticated-orcid":false,"given":"Song","family":"Feng","sequence":"additional","affiliation":[{"name":"Chongqing University of Posts and Telecommunications, Chongqing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5124-3959","authenticated-orcid":false,"given":"Shanshan","family":"Chen","sequence":"additional","affiliation":[{"name":"State Key Laboratory for Manufacturing Systems Engineering, International Joint Laboratory for Micro\/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Yantai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9320-930X","authenticated-orcid":false,"given":"Weixuan","family":"Jing","sequence":"additional","affiliation":[{"name":"State Key Laboratory for Manufacturing Systems Engineering, International Joint Laboratory for Micro\/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Yantai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6101-8173","authenticated-orcid":false,"given":"Libo","family":"Zhao","sequence":"additional","affiliation":[{"name":"State Key Laboratory for Manufacturing Systems Engineering, International Joint Laboratory for Micro\/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Yantai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5557-2653","authenticated-orcid":false,"given":"Zhuangde","family":"Jiang","sequence":"additional","affiliation":[{"name":"State Key Laboratory for Manufacturing Systems Engineering, International Joint Laboratory for Micro\/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Yantai, China"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmmm.2018.02.003"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3047192"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3134672"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2021.3114002"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1108\/ILT-10-2016-0249"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3168228"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2000.877882"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3131467"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2019.2928704"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3144745"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1049\/joe.2018.9192"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2962851"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.110056"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.triboint.2018.07.025"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3116305"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.wear.2019.202934"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2890687"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.triboint.2021.106946"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.107341"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/26\/9\/095101"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.triboint.2017.01.015"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.01.002"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2970681"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.wear.2015.02.055"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3156981"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-017-1351-1"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2016.06.014"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3014799"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2985021"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2958872"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3018066"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/24\/12\/125103"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2988237"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09926164.pdf?arnumber=9926164","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,11,28]],"date-time":"2022-11-28T19:30:04Z","timestamp":1669663804000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9926164\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3216401","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2022]]}}}