{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,27]],"date-time":"2025-03-27T13:32:14Z","timestamp":1743082334073,"version":"3.37.3"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61873133","U1913208","61873135"],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100006606","name":"Natural Science Foundation of Tianjin","doi-asserted-by":"publisher","award":["21JCZDJC00090"],"id":[{"id":"10.13039\/501100006606","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3165806","type":"journal-article","created":{"date-parts":[[2022,4,18]],"date-time":"2022-04-18T20:07:05Z","timestamp":1650312425000},"page":"1-9","source":"Crossref","is-referenced-by-count":19,"title":["An hFFNN-LM Based Real-Time and High Precision Magnet Localization Method"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5162-1665","authenticated-orcid":false,"given":"Yanding","family":"Qin","sequence":"first","affiliation":[{"name":"College of Artificial Intelligence, Nankai University, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3551-3474","authenticated-orcid":false,"given":"Bowen","family":"Lv","sequence":"additional","affiliation":[{"name":"College of Artificial Intelligence, Nankai University, Tianjin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7417-7974","authenticated-orcid":false,"given":"Houde","family":"Dai","sequence":"additional","affiliation":[{"name":"Chinese Academy of Sciences, Quanzhou Institute of Equipment Manufacturing, Haixi Institutes, Jinjiang, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9664-4534","authenticated-orcid":false,"given":"Jianda","family":"Han","sequence":"additional","affiliation":[{"name":"College of Artificial Intelligence, Nankai University, Tianjin, China"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/MRA.2020.2976300"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TIM.2021.3053056"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/JSEN.2020.2965144"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/JSEN.2015.2456181"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/JSEN.2018.2872650"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TMECH.2020.3011732"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TITS.2016.2557066"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/TIM.2021.3075776"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/JSEN.2019.2894386"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1126\/scirobotics.abi8017"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/ICRA48506.2021.9561854"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/ICInfA.2012.6246789"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/IEMBS.2008.4649596"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/IEMBS.2008.4649596"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.3390\/s141120910"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/LMAG.2020.3038586"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1109\/TIM.2021.3069488"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/JSEN.2019.2923585"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.3390\/s21206788"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1016\/S0924-4247(01)00537-4"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1109\/IROS.2005.1545490"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1109\/TIM.2020.2986843"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1109\/MITS.2018.2880269"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1109\/TMAG.2007.907581"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1109\/JSEN.2009.2035711"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1109\/TMAG.2014.2315592"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1109\/TMECH.2014.2341644"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.1109\/ACCESS.2019.2917140"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1109\/TIM.2020.3039645"},{"doi-asserted-by":"publisher","key":"ref30","DOI":"10.1109\/JSEN.2017.2713886"},{"doi-asserted-by":"publisher","key":"ref31","DOI":"10.1109\/ICRA.2013.6630778"},{"doi-asserted-by":"publisher","key":"ref32","DOI":"10.1109\/JSEN.2021.3101299"},{"doi-asserted-by":"publisher","key":"ref33","DOI":"10.1109\/TMAG.2010.2076823"},{"doi-asserted-by":"publisher","key":"ref34","DOI":"10.1109\/IEMBS.2006.260711"},{"doi-asserted-by":"publisher","key":"ref35","DOI":"10.1109\/LRA.2016.2608421"},{"doi-asserted-by":"publisher","key":"ref36","DOI":"10.1109\/SENSORS47087.2021.9639620"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09759101.pdf?arnumber=9759101","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T20:54:26Z","timestamp":1705956866000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9759101\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":36,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3165806","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2022]]}}}