{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T05:58:50Z","timestamp":1725688730491},"reference-count":19,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["IIP-1916535"],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tim.2022.3152317","type":"journal-article","created":{"date-parts":[[2022,2,17]],"date-time":"2022-02-17T20:22:36Z","timestamp":1645129356000},"page":"1-9","source":"Crossref","is-referenced-by-count":5,"title":["Field Coupling Mechanism Investigation of mm-Wave Magnetic Near-Field Probe Based on a Generalized Equivalent Circuit"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"http:\/\/orcid.org\/0000-0001-8855-2798","authenticated-orcid":false,"given":"Shun","family":"Liu","sequence":"first","affiliation":[{"name":"Electromagnetic Compatibility (EMC) Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"}]},{"ORCID":"http:\/\/orcid.org\/0000-0003-1622-7974","authenticated-orcid":false,"given":"Xin","family":"Fang","sequence":"additional","affiliation":[{"name":"Electromagnetic Compatibility (EMC) Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"}]},{"ORCID":"http:\/\/orcid.org\/0000-0003-3322-0336","authenticated-orcid":false,"given":"Taelim","family":"Song","sequence":"additional","affiliation":[{"name":"Advanced Micro Devices (AMD) Inc., Santa Clara, CA, USA"}]},{"ORCID":"http:\/\/orcid.org\/0000-0003-1946-4799","authenticated-orcid":false,"given":"Myung-Hwan","family":"Kim","sequence":"additional","affiliation":[{"name":"Samsung, Suwon, South Korea"}]},{"ORCID":"http:\/\/orcid.org\/0000-0001-9516-8014","authenticated-orcid":false,"given":"Hwan-Woo","family":"Shim","sequence":"additional","affiliation":[{"name":"Samsung, Suwon, South Korea"}]},{"ORCID":"http:\/\/orcid.org\/0000-0002-9593-3908","authenticated-orcid":false,"given":"Chulsoon","family":"Hwang","sequence":"additional","affiliation":[{"name":"Electromagnetic Compatibility (EMC) Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"}]}],"member":"263","reference":[{"key":"ref10","first-page":"567","article-title":"Calibration of the loop probe for the near-field measurement","author":"dimitrijevic","year":"2019","journal-title":"Proc Eur Microw Conf Central Eur (EuMCE)"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2016.2606556"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.4764104"},{"key":"ref13","first-page":"3","article-title":"Theoretical investigations into the transmitting and receiving qualities of antennae","volume":"11","author":"hallen","year":"1938","journal-title":"Nova Acta Regiae Societatis Scientiarum Upsaliensis"},{"key":"ref14","first-page":"458","article-title":"The loop antenna for transmission and reception","volume":"7","author":"king","year":"1969","journal-title":"Antenna Theory part 1 Inter-University Electronics Series"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.823297"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISEMC.2000.875533"},{"key":"ref17","first-page":"245","author":"balanis","year":"2005","journal-title":"Antenna Theory Analysis and Design"},{"key":"ref18","year":"2019","journal-title":"Ansys HFSS v2017 2"},{"key":"ref19","article-title":"The field coupling mechanism study for near field probe","author":"liu","year":"2021"},{"key":"ref4","author":"ott","year":"2011","journal-title":"Electromagnetic Compatibility Engineering"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2218678"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2013.2248011"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2007.902194"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2831398"},{"key":"ref7","article-title":"Spatial resolution study for magnetic near-field probe","author":"xin","year":"2018"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2019.2938634"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2017.2705641"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2019.2946714"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/19\/9717300\/9715728-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9717300\/09715728.pdf?arnumber=9715728","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,16]],"date-time":"2022-05-16T20:08:30Z","timestamp":1652731710000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9715728\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/tim.2022.3152317","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}