{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,11,19]],"date-time":"2024-11-19T17:46:33Z","timestamp":1732038393088},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2020,5]]},"DOI":"10.1109\/tim.2019.2918371","type":"journal-article","created":{"date-parts":[[2019,5,22]],"date-time":"2019-05-22T19:43:18Z","timestamp":1558554198000},"page":"2057-2066","source":"Crossref","is-referenced-by-count":33,"title":["Time-Reversal SAR Imaging for Nondestructive Testing of Circular and Cylindrical Multilayered Dielectric Structures"],"prefix":"10.1109","volume":"69","author":[{"given":"Baolong","family":"Wu","sequence":"first","affiliation":[]},{"given":"Yuan","family":"Gao","sequence":"additional","affiliation":[]},{"given":"Jaime","family":"Laviada","sequence":"additional","affiliation":[]},{"given":"Mohammad Tayeb","family":"Ghasr","sequence":"additional","affiliation":[]},{"given":"Reza","family":"Zoughi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/19.816127"},{"key":"ref32","author":"soumekh","year":"1999","journal-title":"Synthetic Aperture Radar Signal Processing with Matlab Algorithms"},{"key":"ref31","author":"balanis","year":"1999","journal-title":"Advanced Engineering Electromagnetics"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2013.2289355"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2003.1188905"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2013.2269194"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSTARS.2015.2502430"},{"key":"ref13","first-page":"1","article-title":"Near field 3D circular SAR imaging","author":"olivadese","year":"2011","journal-title":"Proc 3rd Int Synthet Aperture Radar (APSAR) AsiaPacific Conf"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/8.954927"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2009.2031903"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2014.2311131"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2016.2647594"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2017.2696421"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/58.156174"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2861078"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2013.2287024"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2017.2762365"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MMM.2012.2205772"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2011.2128875"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1038\/srep20459"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2298618"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2011.5705669"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/83.506760"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/8.855491"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2015.2480415"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/22.942570"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2013.6638424"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1117\/12.777412"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1117\/12.817882"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2426352"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2016.2582959"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2015.2484260"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2003.808730"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/9058729\/08720228.pdf?arnumber=8720228","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T14:29:42Z","timestamp":1651069782000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8720228\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,5]]},"references-count":33,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tim.2019.2918371","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,5]]}}}