{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T11:55:18Z","timestamp":1722513318012},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004543","name":"China Scholarship Council","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004543","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51507091"],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/tim.2018.2854939","type":"journal-article","created":{"date-parts":[[2018,7,24]],"date-time":"2018-07-24T19:34:15Z","timestamp":1532460855000},"page":"704-712","source":"Crossref","is-referenced-by-count":40,"title":["A New Vibration Testing Platform for Electronic Current Transformers"],"prefix":"10.1109","volume":"68","author":[{"ORCID":"http:\/\/orcid.org\/0000-0002-5229-9038","authenticated-orcid":false,"given":"Zhenhua","family":"Li","sequence":"first","affiliation":[]},{"given":"Yuan","family":"Tao","sequence":"additional","affiliation":[]},{"given":"A.","family":"Abu-Siada","sequence":"additional","affiliation":[]},{"given":"Mohammad A. S.","family":"Masoum","sequence":"additional","affiliation":[]},{"given":"Zhenxing","family":"Li","sequence":"additional","affiliation":[]},{"given":"Yanchun","family":"Xu","sequence":"additional","affiliation":[]},{"given":"Xiaozhen","family":"Zhao","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2014.2304570"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"380","DOI":"10.1299\/kikaic.72.380","article-title":"Sensor noise caused by vibrations of flaw detection probe generated in helical heating tubes in a fast breeder reactor and its countermeasures (2nd report, numerical simulations of probe vibration)","volume":"72","author":"inoue","year":"2006","journal-title":"Trans Jpn Soc Mech Eng C"},{"key":"ref12","first-page":"67","article-title":"Research on the interference of primary conductor accentricity to the rogowski coil","volume":"50","author":"chi","year":"2014","journal-title":"High Voltage App"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.4815831"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2015.2418344"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2626018"},{"key":"ref16","year":"2002","journal-title":"Instrument Transformers—Part 8 Electronic Current Transformers"},{"key":"ref17","year":"2002","journal-title":"Instrument Transformers—Part 8 Electronic Current Transformers"},{"key":"ref18","first-page":"62","article-title":"Research on the ECT vibrating test methods","volume":"50","author":"hu","year":"2013","journal-title":"Elect Meas Instrum"},{"key":"ref19","first-page":"3945","article-title":"Earthquake simulation shaking table test on coupling system of 500 kV surge arrester and instrument transformer interconnected with rigid tube bus","volume":"40","author":"cheng","year":"2016","journal-title":"Power Syst Technol"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s11018-016-0936-y"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.843565"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2010.04.001"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.2014.2366207"},{"key":"ref8","first-page":"981","article-title":"Vibration and temperature insensitive fiber-optic current transducer","volume":"36","author":"mu","year":"2010","journal-title":"High Voltage Eng"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/1.3455465"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2015.2510325"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2009184"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICEEE.2006.251907"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.12783\/dtetr\/iceeac2017\/10707"},{"key":"ref22","year":"2004","journal-title":"Specific Communication Service Mapping(SCSM)-Sampled Values Over Serial Unidirectional Multidrop Point to Point Link"},{"key":"ref21","year":"2004","journal-title":"Specific Communication Service Mapping (SCSM) Sampled Values over ISO\/IEC 8802-3"},{"key":"ref24","year":"2002","journal-title":"Instrument Transformers—Part 8 Electronic Current Transformers"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2012.2189590"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/19\/8637784\/08419080.pdf?arnumber=8419080","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T20:57:50Z","timestamp":1657745870000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8419080\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":24,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tim.2018.2854939","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,3]]}}}