{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,7,30]],"date-time":"2024-07-30T19:11:01Z","timestamp":1722366661382},"reference-count":18,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2011,7,1]],"date-time":"2011-07-01T00:00:00Z","timestamp":1309478400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2011,7]]},"DOI":"10.1109\/tim.2011.2113950","type":"journal-article","created":{"date-parts":[[2011,3,4]],"date-time":"2011-03-04T15:39:24Z","timestamp":1299253164000},"page":"2172-2177","source":"Crossref","is-referenced-by-count":55,"title":["Characterization of Metrological Grade Analog-to-Digital Converters Using a Programmable Josephson Voltage Standard"],"prefix":"10.1109","volume":"60","author":[{"given":"Fr\u00e9d\u00e9ric","family":"Overney","sequence":"first","affiliation":[]},{"given":"Alain","family":"Rufenacht","sequence":"additional","affiliation":[]},{"given":"Jean-Pierre","family":"Braun","sequence":"additional","affiliation":[]},{"given":"Blaise","family":"Jeanneret","sequence":"additional","affiliation":[]},{"given":"Paul S.","family":"Wright","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2010575"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2010.5544779"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2008.4574672"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2006963"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2009.2017911"},{"key":"ref15","year":"2007","journal-title":"NI PXI\/PCI-5922 Specifications"},{"key":"ref16","year":"2008","journal-title":"NI-PXI 4461 Specifications"},{"key":"ref17","year":"0","journal-title":"AD7767 specification"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2010.5545056"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.891092"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2099931"},{"key":"ref6","year":"2000","journal-title":"IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2011097"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1140\/epjst\/e2009-01050-6"},{"key":"ref7","year":"2007","journal-title":"IEEE Standard for Digitizing Waveform Recorders"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2030920"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/47\/6\/008"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.843064"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/19\/5784399\/05723007.pdf?arnumber=5723007","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:53:31Z","timestamp":1633910011000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5723007\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,7]]},"references-count":18,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tim.2011.2113950","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,7]]}}}