{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,5]],"date-time":"2025-04-05T10:07:54Z","timestamp":1743847674747,"version":"3.37.3"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100000038","name":"Natural Sciences and Engineering Research Council of Canada","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100000038","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62103387"],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Fellowship of China Postdoctoral Science Foundation","award":["2021M703007"]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,12]]},"DOI":"10.1109\/tie.2023.3239861","type":"journal-article","created":{"date-parts":[[2023,1,31]],"date-time":"2023-01-31T19:18:33Z","timestamp":1675192713000},"page":"12752-12761","source":"Crossref","is-referenced-by-count":16,"title":["A Robust Dissimilarity Distribution Analytics With Laplace Distribution for Incipient Fault Detection"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3927-5656","authenticated-orcid":false,"given":"Wanke","family":"Yu","sequence":"first","affiliation":[{"name":"Department of Chemical and Materials Engineering, University of Alberta, Edmonton, AB, Canada"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0254-5763","authenticated-orcid":false,"given":"Chunhui","family":"Zhao","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Industrial Control Technology, College of Control Science and Engineering, Zhejiang University, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9082-2216","authenticated-orcid":false,"given":"Biao","family":"Huang","sequence":"additional","affiliation":[{"name":"Department of Chemical and Materials Engineering, University of Alberta, Edmonton, AB, Canada"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0668-8315","authenticated-orcid":false,"given":"Min","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Automation, China University of Geosciences, Wuhan, China"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1021\/ie801611s"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.csda.2009.03.014"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2863191"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1093\/bioinformatics\/btg287"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1002\/aic.14888"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2020.2974147"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2014.2387376"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1111\/j.2517-6161.1974.tb00989.x"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3124578"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1214\/aoms\/1177704472"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2019.106515"},{"journal-title":"Pattern Recognition and Machine Learning","year":"2006","author":"bishop","key":"ref32"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2878405"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2972472"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2022.3156296"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2017.05.002"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2020.11.005"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2021.08.014"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3070521"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2017.02.028"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2021.107456"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2810822"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.8b00478"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2017.05.005"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/aic.690480610"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2022.110468"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2018.06.029"},{"key":"ref29","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1111\/j.2517-6161.1977.tb01600.x","article-title":"Maximum likelihood from incomplete data via the EM algorithm","volume":"39","author":"dempster","year":"1977","journal-title":"J R Statist Soc B (Methodological)"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2019.2897946"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2021.09.007"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2019.04.013"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2022.06.011"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2868316"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2022.105182"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2021.107456"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10153933\/10034542.pdf?arnumber=10034542","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,13]],"date-time":"2024-10-13T10:17:14Z","timestamp":1728814634000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10034542\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12]]},"references-count":35,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2023.3239861","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2023,12]]}}}