{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,11,19]],"date-time":"2024-11-19T18:47:29Z","timestamp":1732042049171},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2023,9,1]],"date-time":"2023-09-01T00:00:00Z","timestamp":1693526400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,9,1]],"date-time":"2023-09-01T00:00:00Z","timestamp":1693526400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,9,1]],"date-time":"2023-09-01T00:00:00Z","timestamp":1693526400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"UKICERI DST","award":["RP03391"]},{"name":"SERI-2 DST","award":["RP03357"]},{"name":"SERB NSC Fellowship"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,9]]},"DOI":"10.1109\/tie.2022.3215826","type":"journal-article","created":{"date-parts":[[2022,11,3]],"date-time":"2022-11-03T23:08:58Z","timestamp":1667516938000},"page":"9158-9168","source":"Crossref","is-referenced-by-count":12,"title":["A Novel Multilayer N-LMS Adaptive-Filter-Based Control for Synchronization and Power Quality Improvement in Grid-Tied SPV System"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"http:\/\/orcid.org\/0000-0002-7535-3949","authenticated-orcid":false,"given":"Gaurav","family":"Modi","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Indian Institute of Technology Delhi, New Delhi, India"}]},{"ORCID":"http:\/\/orcid.org\/0000-0003-4759-7484","authenticated-orcid":false,"given":"Bhim","family":"Singh","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Indian Institute of Technology Delhi, New Delhi, India"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1186\/s13705-019-0232-1"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2428734"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2004.835432"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2020.3027203"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2016.2627533"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2014.2347044"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2686440"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2565642"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2823668"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2893857"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2851970"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2273461"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3061027"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2975470"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2808246"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2821704"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3071036"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3085236"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2826068"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2886174"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2020.2974155"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2018.2864822"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.3031529"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2019.2911852"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3134077"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2021.3134141"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2938906"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TASSP.1977.1162997"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TASSP.1987.1165243"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2018.2810499"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2019.2891558"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2885727"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2018.2791968"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2981426"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2015.2496297"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2576644"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2772164"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/10091710\/09929306.pdf?arnumber=9929306","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T22:18:34Z","timestamp":1705961914000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9929306\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9]]},"references-count":37,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tie.2022.3215826","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,9]]}}}