{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T16:52:52Z","timestamp":1729615972771,"version":"3.28.0"},"reference-count":25,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,11]]},"DOI":"10.1109\/test.2010.5699251","type":"proceedings-article","created":{"date-parts":[[2011,1,21]],"date-time":"2011-01-21T20:20:08Z","timestamp":1295641208000},"page":"1-10","source":"Crossref","is-referenced-by-count":6,"title":["Board-level fault diagnosis using an error-flow dictionary"],"prefix":"10.1109","author":[{"given":"Zhaobo","family":"Zhang","sequence":"first","affiliation":[]},{"given":"Zhanglei","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Xinli","family":"Gu","sequence":"additional","affiliation":[]},{"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"System Test and Diagnosis","year":"1994","author":"sheppard","key":"ref10"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583974"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/5326.971655"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355702"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/12.559802"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.1996.547731"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2004.1311877"},{"year":"0","key":"ref17"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355715"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/MMDBMS.1998.709503"},{"key":"ref4","first-page":"1","article-title":"Design for board and system level structural test and diangosis","author":"vo","year":"2006","journal-title":"IEEE International Test Conference"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583986"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1994.292280"},{"key":"ref5","article-title":"A practical perspective on reducing ASIC NTFs","author":"conroy","year":"2006","journal-title":"IEEE International Test Conference"},{"year":"0","key":"ref8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1994.528013"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700554"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.1991.170663"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.1997.633652"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/SSDM.1996.505915"},{"year":"0","key":"ref22"},{"key":"ref21","doi-asserted-by":"crossref","first-page":"835","DOI":"10.1109\/71.298210","article-title":"Parallel algorithms for the longest common subsequence problem","volume":"5","author":"lu","year":"1994","journal-title":"IEEE Trans on Parallel and Distributed Systems"},{"key":"ref24","first-page":"244","author":"zhang","year":"0","journal-title":"Board-level fault diagnosis using Bayesian inference"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2007.328061"},{"year":"0","key":"ref25"}],"event":{"name":"2010 IEEE International Test Conference (ITC)","start":{"date-parts":[[2010,11,2]]},"location":"Austin, TX, USA","end":{"date-parts":[[2010,11,4]]}},"container-title":["2010 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5684496\/5699173\/05699251.pdf?arnumber=5699251","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,19]],"date-time":"2017-06-19T18:44:21Z","timestamp":1497897861000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5699251\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,11]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/test.2010.5699251","relation":{},"subject":[],"published":{"date-parts":[[2010,11]]}}}