{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T08:26:52Z","timestamp":1725784012670},"reference-count":23,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,11]]},"DOI":"10.1109\/test.2010.5699246","type":"proceedings-article","created":{"date-parts":[[2011,1,21]],"date-time":"2011-01-21T20:20:08Z","timestamp":1295641208000},"page":"1-10","source":"Crossref","is-referenced-by-count":13,"title":["Detecting memory faults in the presence of bit line coupling in SRAM devices"],"prefix":"10.1109","author":[{"given":"Sandra","family":"Irobi","sequence":"first","affiliation":[]},{"given":"Zaid","family":"Al-Ars","sequence":"additional","affiliation":[]},{"given":"Said","family":"Hamdioui","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2003.1183143"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/43.55188"},{"key":"ref12","first-page":"411","article-title":"Influence of parasitic capacitance variations on 65nm and 32nm predictive technology model sram core-cells","author":"dicarlo","year":"2008","journal-title":"17th Asian Test Symposium"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2006.203"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IDT.2007.4437418"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2000257"},{"key":"ref16","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4757-6706-3","author":"hamdioui","year":"2004","journal-title":"Testing Static Random Access Memories Defects Fault Models and test Patterns"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.56"},{"key":"ref18","first-page":"256","article-title":"Defect oriented fault analysis for sram","author":"huang","year":"2003","journal-title":"Proc 12th Asian Test Symp"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469624"},{"key":"ref4","first-page":"1650","article-title":"Dual sense ampified bit lines (dsabl) architecture for low-power sram design","author":"aly","year":"2005","journal-title":"Proc Of ISCAS"},{"key":"ref3","article-title":"Evaluation of sram faulty behavior under bit line coupling","author":"ai-ars","year":"2008","journal-title":"Proc IEEE Int Design and Test Workshop"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/4.126554"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-95424-5"},{"key":"ref8","article-title":"Noise reduction techniques for an eel-cmos ram with a 2 ns write cyele time","author":"ohhata","year":"1992","journal-title":"Proc Bipolar\/BiCMOS Circuits and Technology Meeting"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/4.910490"},{"key":"ref2","article-title":"Analysis of a deceptive destructive read memory fault model and recommended testing","author":"adams","year":"1996","journal-title":"Proc IEEE North Atlantic Test Workshop"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/356914.356916"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/4.881209"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2003.1253788"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386943"},{"journal-title":"Testing Semiconductor Memories Theory and Practice","year":"1998","author":"van de goor","key":"ref21"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.884077"}],"event":{"name":"2010 IEEE International Test Conference (ITC)","start":{"date-parts":[[2010,11,2]]},"location":"Austin, TX, USA","end":{"date-parts":[[2010,11,4]]}},"container-title":["2010 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5684496\/5699173\/05699246.pdf?arnumber=5699246","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,19]],"date-time":"2017-06-19T18:44:30Z","timestamp":1497897870000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5699246\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,11]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/test.2010.5699246","relation":{},"subject":[],"published":{"date-parts":[[2010,11]]}}}