{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T21:32:43Z","timestamp":1725571963257},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,11]]},"DOI":"10.1109\/test.2009.5355639","type":"proceedings-article","created":{"date-parts":[[2009,12,24]],"date-time":"2009-12-24T13:29:18Z","timestamp":1261661358000},"page":"1-1","source":"Crossref","is-referenced-by-count":2,"title":["IEEE P1687 IJTAG a presentation of current technology"],"prefix":"10.1109","author":[{"given":"Ken","family":"Posse","sequence":"first","affiliation":[]},{"given":"Al","family":"Crouch","sequence":"additional","affiliation":[]},{"given":"Jeff","family":"Rearick","sequence":"additional","affiliation":[]}],"member":"263","event":{"name":"2009 IEEE International Test Conference (ITC)","start":{"date-parts":[[2009,11,1]]},"location":"Austin, TX, USA","end":{"date-parts":[[2009,11,6]]}},"container-title":["2009 International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5348788\/5355529\/05355639.pdf?arnumber=5355639","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T23:40:41Z","timestamp":1489880441000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5355639\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,11]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/test.2009.5355639","relation":{},"subject":[],"published":{"date-parts":[[2009,11]]}}}