{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T19:34:36Z","timestamp":1725651276615},"reference-count":5,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,10]]},"DOI":"10.1109\/test.2008.4700707","type":"proceedings-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T12:55:58Z","timestamp":1228913758000},"page":"1-7","source":"Crossref","is-referenced-by-count":11,"title":["On-chip Timing Uncertainty Measurements on IBM Microprocessors"],"prefix":"10.1109","author":[{"given":"R.","family":"Franch","sequence":"first","affiliation":[]},{"given":"P.","family":"Restle","sequence":"additional","affiliation":[]},{"given":"N.","family":"James","sequence":"additional","affiliation":[]},{"given":"W.","family":"Huott","sequence":"additional","affiliation":[]},{"given":"J.","family":"Friedrich","sequence":"additional","affiliation":[]},{"given":"R.","family":"Dixon","sequence":"additional","affiliation":[]},{"given":"S.","family":"Weitzel","sequence":"additional","affiliation":[]},{"given":"K.","family":"Van Goor","sequence":"additional","affiliation":[]},{"given":"G.","family":"Salem","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2006.1696064"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2005.1493930"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2004.1332740"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373412"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373605"}],"event":{"name":"2008 IEEE International Test Conference","start":{"date-parts":[[2008,10,28]]},"location":"Santa Clara, CA","end":{"date-parts":[[2008,10,30]]}},"container-title":["2008 IEEE International Test Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690905\/4700527\/04700707.pdf?arnumber=4700707","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T11:52:46Z","timestamp":1489751566000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4700707\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,10]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/test.2008.4700707","relation":{},"subject":[],"published":{"date-parts":[[2008,10]]}}}