{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T00:18:24Z","timestamp":1725495504295},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2005.1583968","type":"proceedings-article","created":{"date-parts":[[2006,2,6]],"date-time":"2006-02-06T10:51:40Z","timestamp":1139223100000},"page":"120-128","source":"Crossref","is-referenced-by-count":9,"title":["Test methodology for freescale's high performance e600 core based on powerPC instruction set architecture"],"prefix":"10.1109","author":[{"given":"N.","family":"Tendolkar","sequence":"first","affiliation":[]},{"given":"D.","family":"Belete","sequence":"additional","affiliation":[]},{"given":"A.","family":"Razdan","sequence":"additional","affiliation":[]},{"given":"H.","family":"Reyes","sequence":"additional","affiliation":[]},{"given":"B.","family":"Schwarz","sequence":"additional","affiliation":[]},{"given":"M.","family":"Sullivan","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041808"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805623"},{"journal-title":"Built-In Test for VLSI Pseudorandom Techniques","year":"1987","author":"bardell","key":"10"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894200"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894302"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011103"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843819"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041868"},{"journal-title":"IEEE P1500 Web Site","year":"0","key":"9"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743146"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805650"},{"key":"12","doi-asserted-by":"crossref","first-page":"586","DOI":"10.1109\/TEST.2001.966677","article-title":"99% AC test coverage using only LBIST on the 1 GHz IBM S\/390 z Series 900 Microprocessors","author":"kusko","year":"2001","journal-title":"Proc IEEE Int'l Test Conference"}],"event":{"name":"IEEE International Conference on Test, 2005.","location":"Charlotte, NC, USA"},"container-title":["IEEE International Conference on Test, 2005."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10560\/33431\/01583968.pdf?arnumber=1583968","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T22:59:32Z","timestamp":1497653972000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1583968\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/test.2005.1583968","relation":{},"subject":[]}}