{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T15:11:33Z","timestamp":1730301093054,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.2004.1387369","type":"proceedings-article","created":{"date-parts":[[2005,3,21]],"date-time":"2005-03-21T15:07:39Z","timestamp":1111417659000},"page":"1034-1043","source":"Crossref","is-referenced-by-count":1,"title":["Identifying untestable transition faults in latch based designs with multiple clocks"],"prefix":"10.1109","author":[{"given":"M.","family":"Syal","sequence":"first","affiliation":[]},{"given":"S.","family":"Chakravarty","sequence":"additional","affiliation":[]},{"given":"M.S.","family":"Hsiao","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/92.502203"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1997.600290"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/43.406717"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2003.1253626"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2003.1197680"},{"key":"ref4","article-title":"Transition Fault Testing for Sequential Circuits","volume":"12","author":"chang","year":"1993","journal-title":"IEEE Transactions on CAD of Integrated Circuits and Systems"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1991.519696"},{"key":"ref6","article-title":"On Generating High Quality Tests for Transition Faults","author":"yun","year":"2002","journal-title":"Proceedings of 11th Asian Test Symposium"},{"key":"ref5","article-title":"Algorithms for Transition Faults","author":"liu","year":"2002","journal-title":"Proc 7th IEEE Eur Test Workshop"},{"key":"ref8","first-page":"983","article-title":"Techniques to Reduce Test Data Volume and Application Time for Transition Test","author":"liu","year":"2002","journal-title":"Proceedings of the IEEE International Test Conference"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1999.781060"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/43.238615"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1994.292299"},{"key":"ref9","first-page":"36","article-title":"Procedures for Identifying Untestable and Redundant Transition Faults in Synchronous Sequential Circuits","author":"gang","year":"2003","journal-title":"Proceedings of the 21st International Conference on Computer Design"}],"event":{"name":"International Test Conference 2004","acronym":"TEST-04","location":"Charlotte, NC, USA"},"container-title":["2004 International Conferce on Test"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9526\/30190\/01387369.pdf?arnumber=1387369","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T19:58:07Z","timestamp":1489521487000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1387369\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/test.2004.1387369","relation":{},"subject":[]}}