{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T20:29:25Z","timestamp":1729628965466,"version":"3.28.0"},"reference-count":21,"publisher":"IEEE Comput. Soc. Press","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/test.1988.207857","type":"proceedings-article","created":{"date-parts":[[2003,1,6]],"date-time":"2003-01-06T19:03:04Z","timestamp":1041879784000},"page":"719-729","source":"Crossref","is-referenced-by-count":45,"title":["Circular BIST with partial scan"],"prefix":"10.1109","author":[{"given":"M.M.","family":"Pradhan","sequence":"first","affiliation":[]},{"given":"E.J.","family":"O'Brien","sequence":"additional","affiliation":[]},{"given":"S.L.","family":"Lam","sequence":"additional","affiliation":[]},{"given":"J.","family":"Beausang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1988.14726"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"407","DOI":"10.1145\/37888.37949","article-title":"circular self-test path: a low-cost bist technique","author":"krasniewski","year":"1987","journal-title":"24th ACM\/IEEE Design Automation Conference"},{"key":"ref12","first-page":"428","article-title":"CONES: A System for Automated Synthesis of VLSI and Programmable Logic from Behavioral Models","author":"stroud","year":"1986","journal-title":"Proc IEEE 1986 Intl Conf on Comput -Aided Des (ICCAD-86)"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1987.1676905"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1988.14961"},{"journal-title":"private communication","year":"1988","author":"pilarski","key":"ref15"},{"key":"ref16","first-page":"375","article-title":"ESIM\/AFS - A Concurrent, Architectural Level Fault Simulator","author":"davidson","year":"1986","journal-title":"Proc 1986 IEEE Int Test Conf"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1976.1674668"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1984.1676470"},{"key":"ref19","first-page":"57","article-title":"A Sequential Circuit Test Generation System","author":"mallela","year":"1985","journal-title":"1985 IEEE Int Test Conf Proc"},{"key":"ref4","first-page":"153","article-title":"Incomplete Scan Path with an Automatic Test Generation Methodology","author":"trischler","year":"1980","journal-title":"Proc 1980 Int Test Conf"},{"key":"ref3","first-page":"44","article-title":"A Complete Solution to the Partial Scan Problem","author":"agrawal","year":"1987","journal-title":"Proc 1987 Int Test Conf"},{"journal-title":"Boundary Scan Architecture Standard Proposal","year":"1988","key":"ref6"},{"key":"ref5","first-page":"714","article-title":"Boundary-Scan: A Framework for Structured Design-For-Test","author":"maunder","year":"1987","journal-title":"Proc 1987 Int Test Conf"},{"key":"ref8","first-page":"200","article-title":"Self-Testing of Multichip Logic Modules","author":"bardell","year":"1982","journal-title":"Proc 1982 Int Test Conf"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.1986.295038"},{"key":"ref2","first-page":"165","article-title":"A Logic Design Structure for LSI Testability","volume":"2","author":"eichelberger","year":"1978","journal-title":"J Des Automat Fault Tolerant Comput"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1983.12531"},{"key":"ref9","first-page":"37","article-title":"Built-in Logic Block Observation Techniques","author":"konemann","year":"1979","journal-title":"Proc 1979 Int Test Conf"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1979.1084687"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1980.1585245"}],"event":{"name":"International Test Conference 1988 Proceeding@m_New Frontiers in Testing","location":"Washington, DC, USA"},"container-title":["International Test Conference 1988 Proceeding@m_New Frontiers in Testing"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx2\/213\/5318\/00207857.pdf?arnumber=207857","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,15]],"date-time":"2017-06-15T17:14:22Z","timestamp":1497546862000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/207857\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/test.1988.207857","relation":{},"subject":[]}}