{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,1,9]],"date-time":"2025-01-09T05:31:36Z","timestamp":1736400696501,"version":"3.32.0"},"reference-count":1,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. II"],"published-print":{"date-parts":[[2025,1]]},"DOI":"10.1109\/tcsii.2024.3473488","type":"journal-article","created":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T17:31:33Z","timestamp":1729618293000},"page":"353-353","source":"Crossref","is-referenced-by-count":0,"title":["Erratum to \u201cA 1\u201327 GHz SiGe Low Noise Amplifier With 27-dB Peak Gain and 2.85\u00b11. 45 dB NF\u201d"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5572-4191","authenticated-orcid":false,"given":"Zongxiang","family":"Wang","sequence":"first","affiliation":[{"name":"State Key Laboratory of Millimeter Waves, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0458-5184","authenticated-orcid":false,"given":"Jixin","family":"Chen","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Millimeter Waves, Southeast University, Nanjing, China"}]},{"given":"Debin","family":"Hou","sequence":"additional","affiliation":[{"name":"Research and Development Department, MISIC Microelectronics, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5001-2099","authenticated-orcid":false,"given":"Peigen","family":"Zhou","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Millimeter Waves, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1214-0564","authenticated-orcid":false,"given":"Zhe","family":"Chen","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Millimeter Waves, Southeast University, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1201-0727","authenticated-orcid":false,"given":"Long","family":"Wang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Millimeter Waves, Southeast University, Nanjing, China"}]},{"given":"Xiaojie","family":"Xu","sequence":"additional","affiliation":[{"name":"Research and Development Department, MISIC Microelectronics, Nanjing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3478-2744","authenticated-orcid":false,"given":"Wei","family":"Hong","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Millimeter Waves, Southeast University, Nanjing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2024.3350112"}],"container-title":["IEEE Transactions on Circuits and Systems II: Express Briefs"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8920\/10814916\/10729228.pdf?arnumber=10729228","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,8]],"date-time":"2025-01-08T20:46:49Z","timestamp":1736369209000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10729228\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,1]]},"references-count":1,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tcsii.2024.3473488","relation":{},"ISSN":["1549-7747","1558-3791"],"issn-type":[{"type":"print","value":"1549-7747"},{"type":"electronic","value":"1558-3791"}],"subject":[],"published":{"date-parts":[[2025,1]]}}}