{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,23]],"date-time":"2024-08-23T12:37:52Z","timestamp":1724416672762},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2010,7,1]],"date-time":"2010-07-01T00:00:00Z","timestamp":1277942400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2010,7]]},"DOI":"10.1109\/tcad.2010.2049059","type":"journal-article","created":{"date-parts":[[2010,6,24]],"date-time":"2010-06-24T18:33:35Z","timestamp":1277404415000},"page":"1056-1069","source":"Crossref","is-referenced-by-count":20,"title":["Voltage and Temperature Aware Statistical Leakage Analysis Framework Using Artificial Neural Networks"],"prefix":"10.1109","volume":"29","author":[{"given":"V.","family":"Janakiraman","sequence":"first","affiliation":[]},{"given":"Amrutur","family":"Bharadwaj","sequence":"additional","affiliation":[]},{"given":"V.","family":"Visvanathan","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2003.821549"},{"key":"ref11","first-page":"19","article-title":"full-chip sub-threshold leakage power prediction model for sub-0.18 m cmos","author":"narendra","year":"2002","journal-title":"Proc ISLPED"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/22.390193"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2006.873517"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.882518"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI.2008.38"},{"key":"ref16","first-page":"99","article-title":"statistical analysis of full-chip leakage power considering junction tunneling leakage","author":"tao li","year":"2007","journal-title":"2007 44th ACM\/IEEE Design Automation Conference DAC"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2007.11"},{"key":"ref18","author":"ross","year":"2006","journal-title":"Introduction to Probability Models"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1166\/jolpe.2008.187"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/1230800.1230804"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775920"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/871506.871529"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.885683"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2004.831560"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.923251"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.858351"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/40.782564"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/4.881202"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2005.1609253"},{"key":"ref20","author":"bishop","year":"2007","journal-title":"Neural Networks for Pattern Recognition"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065716"},{"key":"ref21","author":"weisstein","year":"0","journal-title":"Hermite-Gauss quadrature"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2002.808156"},{"key":"ref23","author":"srivastava","year":"2005","journal-title":"Statistical Analysis and Optimization for VLSI Timing and Power"},{"key":"ref26","year":"2009","journal-title":"International Technology Roadmap for Semiconductors"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/0893-6080(89)90020-8"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/43\/5487456\/05487472.pdf?arnumber=5487472","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T00:45:38Z","timestamp":1633913138000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5487472\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,7]]},"references-count":27,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2010.2049059","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,7]]}}}