{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,29]],"date-time":"2025-03-29T16:21:59Z","timestamp":1743265319389},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2010,1,1]],"date-time":"2010-01-01T00:00:00Z","timestamp":1262304000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Automat. Sci. Eng."],"published-print":{"date-parts":[[2010,1]]},"DOI":"10.1109\/tase.2008.2005418","type":"journal-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T20:58:23Z","timestamp":1228942703000},"page":"58-72","source":"Crossref","is-referenced-by-count":42,"title":["Performance Evaluation for Motif-Based Patterned Texture Defect Detection"],"prefix":"10.1109","volume":"7","author":[{"given":"H.Y.T.","family":"Ngan","sequence":"first","affiliation":[]},{"given":"G.K.H.","family":"Pang","sequence":"additional","affiliation":[]},{"given":"N.H.C.","family":"Yung","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1117\/1.2345189"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2004.07.009"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1177\/004051750307300515"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1080\/0232929032000115083"},{"key":"ref36","year":"2000"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2004.1262332"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2008.917140"},{"key":"ref10","doi-asserted-by":"crossref","first-page":"674","DOI":"10.1109\/34.192463","article-title":"a theory for multiresolution signal decomposition: the wavelet representation","volume":"11","author":"mallat","year":"1989","journal-title":"IEEE Trans Pattern Anal Machine Intell"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1117\/12.580395"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.1997.632054"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/28.806035"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1117\/1.1517290"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/S0262-8856(03)00003-9"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2003.10.011"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.imavis.2006.07.028"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s001700070055"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/S0031-3203(02)00017-1"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1191\/0142331204tm112oa"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2007.11.014"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/S1077-2014(98)90002-X"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/S0723-0869(02)80019-6"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1979.11328"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2002.1010791"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.1982.4767309"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1177\/004051750207200312"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/28.871274"},{"key":"ref2","year":"2008","journal-title":"Wikipedia"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/S0262-8856(03)00007-6"},{"key":"ref1","author":"grunbaum","year":"1987","journal-title":"Tilings and Patterns"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/28.993164"},{"key":"ref22","doi-asserted-by":"crossref","first-page":"10005","DOI":"10.1109\/WCICA.2006.1713955","article-title":"defect detection in textiles using optimal gabor wavelet filter","author":"liu","year":"2006","journal-title":"Proc 3rd World Congr Intell Contr Automat"},{"key":"ref21","first-page":"3378","article-title":"fabric defects automatic detection using gabor filters","author":"shu","year":"2004","journal-title":"Proc 3rd World Congr Intell Control Automation"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ISPACS.2005.1595347"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2007.02.019"},{"key":"ref26","first-page":"9\/1","article-title":"machine vision in the inspection of patterned textile webs","author":"tao","year":"1997","journal-title":"IEE Colloquium on Industrial Inspection (Ref No 1997\/041)"},{"key":"ref25","first-page":"215","article-title":"the automated inspection of lace using machine vision","volume":"5","author":"sandy","year":"1995","journal-title":"Journal of Mechanisms"}],"container-title":["IEEE Transactions on Automation Science and Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8856\/5361440\/04703186.pdf?arnumber=4703186","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:59:44Z","timestamp":1633910384000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4703186\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,1]]},"references-count":36,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tase.2008.2005418","relation":{},"ISSN":["1545-5955","1558-3783"],"issn-type":[{"value":"1545-5955","type":"print"},{"value":"1558-3783","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,1]]}}}