{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,30]],"date-time":"2025-03-30T15:06:17Z","timestamp":1743347177863},"reference-count":11,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/olt.2001.937816","type":"proceedings-article","created":{"date-parts":[[2002,11,13]],"date-time":"2002-11-13T11:55:27Z","timestamp":1037188527000},"page":"43-47","source":"Crossref","is-referenced-by-count":5,"title":["Logic optimization of unidirectional circuits with structural methods"],"prefix":"10.1109","author":[{"given":"L.","family":"Entrena","sequence":"first","affiliation":[]},{"given":"C.","family":"Lopez","sequence":"additional","affiliation":[]},{"given":"E.","family":"Olias","sequence":"additional","affiliation":[]},{"given":"E.","family":"San Millan","sequence":"additional","affiliation":[]},{"given":"J.A.","family":"Espejo","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/92.285745"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/43.229762"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2001.915054"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008257118423"},{"key":"ref11","article-title":"SIS: A System for Sequential Circuit Synthesis","author":"sentovich","year":"1992","journal-title":"Electron Res Lab"},{"key":"ref5","article-title":"Design of Self-Checking Unidirectional Combinational Circuits with Low Area Overhead","author":"saposhnikov","year":"1996","journal-title":"Proc 2 nd Int On-Line Testing Workshop"},{"key":"ref8","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4757-2572-8","article-title":"Reasoning in Boolean Networks: logic synthesis and verification using testing techniques","author":"kunz","year":"1997"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/43.391740"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/BF00971960"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1994.326893"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008244815697"}],"event":{"name":"Seventh International On-Line Testing Workshop. IOLTW 2001","acronym":"OLT-01","location":"Taormina, Italy"},"container-title":["Proceedings Seventh International On-Line Testing Workshop"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/7458\/20291\/00937816.pdf?arnumber=937816","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,15]],"date-time":"2017-06-15T10:56:31Z","timestamp":1497524191000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/937816\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/olt.2001.937816","relation":{},"subject":[]}}