{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T07:27:21Z","timestamp":1725694041198},"reference-count":31,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,9,27]],"date-time":"2023-09-27T00:00:00Z","timestamp":1695772800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,9,27]],"date-time":"2023-09-27T00:00:00Z","timestamp":1695772800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,9,27]]},"DOI":"10.1109\/mmsp59012.2023.10337666","type":"proceedings-article","created":{"date-parts":[[2023,12,8]],"date-time":"2023-12-08T19:10:51Z","timestamp":1702062651000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Gallery-Query Protocol for Evaluating Face Image Quality Metrics"],"prefix":"10.1109","author":[{"given":"Haoyu","family":"Chen","sequence":"first","affiliation":[{"name":"Elmore Family School of Electrical and Computer Engineering, Purdue University"}]},{"given":"Praneet","family":"Singh","sequence":"additional","affiliation":[{"name":"Elmore Family School of Electrical and Computer Engineering, Purdue University"}]},{"given":"Edward J.","family":"Delp","sequence":"additional","affiliation":[{"name":"Elmore Family School of Electrical and Computer Engineering, Purdue University"}]},{"given":"Amy R.","family":"Reibman","sequence":"additional","affiliation":[{"name":"Elmore Family School of Electrical and Computer Engineering, Purdue University"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MIPR54900.2022.00043"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2005.268"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.6028\/nist.ir.8009"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.1991.139758"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/34.598228"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-97909-0_46"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/WACV56688.2023.00348"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3266068"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00474"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.01400"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.00165"},{"volume-title":"ISO\/IEC 29794-1:2016: Information technology \u2014 biometric sample quality \u2014 part 1: Framework","year":"2016","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/BTAS.2014.6996248"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2015.7351562"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2018.2799585"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICB45273.2019.8987255"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.00569"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.00758"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/icip.2009.5414000"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00482"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46487-9_6"},{"volume-title":"DeepGlint: Face feature test\/trillion pairs","year":"2022","author":"Deng","key":"ref23"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2012.2214050"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2012.2227726"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/NCC.2015.7084843"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2007.1019"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICCVW54120.2021.00166"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.6028\/NIST.IR.8382"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICB2018.2018.00033"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ICISCE.2017.95"}],"event":{"name":"2023 IEEE 25th International Workshop on Multimedia Signal Processing (MMSP)","start":{"date-parts":[[2023,9,27]]},"location":"Poitiers, France","end":{"date-parts":[[2023,9,29]]}},"container-title":["2023 IEEE 25th International Workshop on Multimedia Signal Processing (MMSP)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10337652\/10337633\/10337666.pdf?arnumber=10337666","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,12,19]],"date-time":"2023-12-19T22:24:58Z","timestamp":1703024698000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10337666\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,9,27]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/mmsp59012.2023.10337666","relation":{},"subject":[],"published":{"date-parts":[[2023,9,27]]}}}