{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,19]],"date-time":"2024-09-19T16:26:25Z","timestamp":1726763185841},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100014188","name":"Engineering Research Center of Excellence Program through the National Research Foundation (NRF) of Korea, Ministry of Science and ICT (MSIT), South Korea","doi-asserted-by":"publisher","award":["NRF-2017R1A5A1014708"],"id":[{"id":"10.13039\/501100014188","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003836","name":"Chip Fabrication and EDA Tool through the IC Design Education Center (IDEC), South Korea","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003836","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE J. Solid-State Circuits"],"published-print":{"date-parts":[[2023,3]]},"DOI":"10.1109\/jssc.2022.3230424","type":"journal-article","created":{"date-parts":[[2023,1,2]],"date-time":"2023-01-02T18:59:09Z","timestamp":1672685949000},"page":"720-731","source":"Crossref","is-referenced-by-count":7,"title":["A High-Efficiency Single-Mode Dual-Path Buck-Boost Converter With Reduced Inductor Current"],"prefix":"10.1109","volume":"58","author":[{"ORCID":"http:\/\/orcid.org\/0000-0002-4472-0849","authenticated-orcid":false,"given":"Donghee","family":"Cho","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}]},{"ORCID":"http:\/\/orcid.org\/0000-0001-5596-2504","authenticated-orcid":false,"given":"Hyungjoo","family":"Cho","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}]},{"ORCID":"http:\/\/orcid.org\/0000-0002-1540-5102","authenticated-orcid":false,"given":"Sein","family":"Oh","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}]},{"ORCID":"http:\/\/orcid.org\/0000-0003-0461-6729","authenticated-orcid":false,"given":"Yoontae","family":"Jung","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}]},{"ORCID":"http:\/\/orcid.org\/0000-0003-3589-086X","authenticated-orcid":false,"given":"Sohmyung","family":"Ha","sequence":"additional","affiliation":[{"name":"Division of Engineering, New York University Abu Dhabi, Abu Dhabi, United Arab Emirates"}]},{"ORCID":"http:\/\/orcid.org\/0000-0002-3882-6022","authenticated-orcid":false,"given":"Chul","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Bio and Brain Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}]},{"ORCID":"http:\/\/orcid.org\/0000-0003-4580-2771","authenticated-orcid":false,"given":"Minkyu","family":"Je","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2193144"},{"key":"ref2","first-page":"3741","article-title":"Electrochemical impedance analysis on degradation of commercially available lithium ion battery during charge\u2013discharge cycling","volume-title":"Proc. 39th IEEE Annu. Power Electron. Spec. Conf.","author":"Mukoyama"},{"issue":"4","key":"ref3","first-page":"444","article-title":"Analysis of PWM nonlinearity in non-inverting buck\u2013boost power converters","volume":"41","author":"Paul","year":"2012","journal-title":"Chem. Letters."},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICIEA.2011.5975910"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CICC53496.2022.9772861"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3098495"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3056478"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2010.5433986"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2294189"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870322"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2162921"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2567484"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2883257"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2704597"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2018.8310367"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9063105"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2188842"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2882526"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2954109"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.23919\/VLSICircuits52068.2021.9492409"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-7646-4"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2011.5746366"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2550498"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/4.661206"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2017.2724847"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2346770"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3044062"}],"container-title":["IEEE Journal of Solid-State Circuits"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4\/10051119\/10004617.pdf?arnumber=10004617","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,9]],"date-time":"2024-02-09T05:35:00Z","timestamp":1707456900000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10004617\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3]]},"references-count":27,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/jssc.2022.3230424","relation":{},"ISSN":["0018-9200","1558-173X"],"issn-type":[{"value":"0018-9200","type":"print"},{"value":"1558-173X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,3]]}}}