{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:18:57Z","timestamp":1740100737845,"version":"3.37.3"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,8,18]],"date-time":"2021-08-18T00:00:00Z","timestamp":1629244800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,8,18]],"date-time":"2021-08-18T00:00:00Z","timestamp":1629244800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003819","name":"Natural Science Foundation of Hubei Province","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003819","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,8,18]]},"DOI":"10.1109\/itc-asia53059.2021.9808799","type":"proceedings-article","created":{"date-parts":[[2022,6,30]],"date-time":"2022-06-30T19:41:55Z","timestamp":1656618115000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Developing Formal Models for Measuring Fault Effects Using Functional EDA Tools"],"prefix":"10.1109","author":[{"given":"Wei","family":"Hu","sequence":"first","affiliation":[{"name":"Northwestern Polytechnical University,School of Cybersecurity,Xi’an,China,710072"}]},{"given":"Jing","family":"Tan","sequence":"additional","affiliation":[{"name":"Northwestern Polytechnical University,School of Cybersecurity,Xi’an,China,710072"}]},{"given":"Lingjuan","family":"Wu","sequence":"additional","affiliation":[{"name":"Huazhong Agricultural University,College of Informatics,Wuhan,China,430070"}]},{"given":"Yu","family":"Tai","sequence":"additional","affiliation":[{"name":"Northwestern Polytechnical University,School of Cybersecurity,Xi’an,China,710072"}]},{"given":"Liang","family":"Hong","sequence":"additional","affiliation":[{"name":"Northwestern Polytechnical University,School of Cybersecurity,Xi’an,China,710072"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/FDL.2016.7880368"},{"key":"ref11","article-title":"A meta-model-based approach for semantic fault modeling on multiple abstraction levels","author":"schwarz","year":"2015","journal-title":"Design and Verification Conference and Exhibition Europe"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.14569\/IJACSA.2018.091201"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2012.6219064"},{"key":"ref14","article-title":"An automatic test pattern generation method for multiple stuck-at faults by incrementally extending the test patterns","author":"wang","year":"2019","journal-title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2011.75"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2008.4538785"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5457048"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228528"},{"key":"ref4","article-title":"X-propagation woes: Masking bugs at RTL and unnecessary debug at the netlist","author":"piper","year":"2012","journal-title":"DVCON"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ECS.2014.6892760"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.23919\/DATE48585.2020.9116483"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IVSW.2018.8494881"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/43.46788"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/12.53597"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035351"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2019.8758668"},{"key":"ref9","first-page":"171","article-title":"A survey on fault injection techniques","volume":"1","author":"ziade","year":"2004","journal-title":"Int Arab J Inf Technol"}],"event":{"name":"2021 IEEE International Test Conference in Asia (ITC-Asia)","start":{"date-parts":[[2021,8,18]]},"location":"Shanghai, China","end":{"date-parts":[[2021,8,20]]}},"container-title":["2021 IEEE International Test Conference in Asia (ITC-Asia)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9808359\/9808467\/09808799.pdf?arnumber=9808799","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,9,5]],"date-time":"2022-09-05T20:22:30Z","timestamp":1662409350000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9808799\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,8,18]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/itc-asia53059.2021.9808799","relation":{},"subject":[],"published":{"date-parts":[[2021,8,18]]}}}