{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:18:57Z","timestamp":1740100737794,"version":"3.37.3"},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,8,18]],"date-time":"2021-08-18T00:00:00Z","timestamp":1629244800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,8,18]],"date-time":"2021-08-18T00:00:00Z","timestamp":1629244800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,8,18]]},"DOI":"10.1109\/itc-asia53059.2021.9808628","type":"proceedings-article","created":{"date-parts":[[2022,6,30]],"date-time":"2022-06-30T19:41:55Z","timestamp":1656618115000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["An optimized DFT technology based on machine learning"],"prefix":"10.1109","author":[{"given":"Han","family":"Yang","sequence":"first","affiliation":[{"name":"Nanjing University of Posts and Telecommunications, #9, Wenyuan Road,College of Electronic and Optical Engineering,Nanjing City,People’s Republic of China,210003"}]},{"given":"Zeyu","family":"Zhao","sequence":"additional","affiliation":[{"name":"Nanjing University of Posts and Telecommunications, #9, Wenyuan Road,College of Electronic and Optical Engineering,Nanjing City,People’s Republic of China,210003"}]},{"given":"Zhikuang","family":"Cai","sequence":"additional","affiliation":[{"name":"Nanjing University of Posts and Telecommunications, #9, Wenyuan Road,College of Electronic and Optical Engineering,Nanjing City,People’s Republic of China,210003"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ITC-Asia51099.2020.00034"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ATS47505.2019.000-9"},{"article-title":"Methods and systems for circuit fault diagnosis","year":"2015","author":"goel","key":"ref10"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.105"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISVDAT.2015.7208149"},{"journal-title":"VLSI Test Principles and Architectures Design for Testability","year":"2006","author":"wang","key":"ref8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2017.50"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ITC44170.2019.9000136"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2014.6908369"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2017.7928956"}],"event":{"name":"2021 IEEE International Test Conference in Asia (ITC-Asia)","start":{"date-parts":[[2021,8,18]]},"location":"Shanghai, China","end":{"date-parts":[[2021,8,20]]}},"container-title":["2021 IEEE International Test Conference in Asia (ITC-Asia)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9808359\/9808467\/09808628.pdf?arnumber=9808628","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,9,5]],"date-time":"2022-09-05T20:22:20Z","timestamp":1662409340000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9808628\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,8,18]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/itc-asia53059.2021.9808628","relation":{},"subject":[],"published":{"date-parts":[[2021,8,18]]}}}