{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T01:26:44Z","timestamp":1725758804374},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,2]]},"DOI":"10.1109\/isscc.2018.8310372","type":"proceedings-article","created":{"date-parts":[[2018,3,16]],"date-time":"2018-03-16T15:53:18Z","timestamp":1521215598000},"page":"438-440","source":"Crossref","is-referenced-by-count":4,"title":["An on-chip resonant-gate-drive switched-capacitor converter for near-threshold computing achieving 70.2% efficiency at 0.92A\/mm2<\/sup> current density and 0.4V output"],"prefix":"10.1109","author":[{"given":"Moataz","family":"Abdelfattah","sequence":"first","affiliation":[]},{"given":"Muhammad","family":"Swilam","sequence":"additional","affiliation":[]},{"given":"Brian","family":"Dupaix","sequence":"additional","affiliation":[]},{"given":"Shane","family":"Smith","sequence":"additional","affiliation":[]},{"given":"Ayman","family":"Fayed","sequence":"additional","affiliation":[]},{"given":"Waleed","family":"Khalil","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"178","article-title":"A 1. 1W\/mm2-Power-Density 82%-Efficiency Fully Integrated 3: 1 Switched-Capacitor DC-DC Converter in Baseline 28nm CMOS Using Stage Outphasing and Multiphase Soft-Charging","author":"butzen","year":"2017","journal-title":"ISSCC"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/JSSC.2013.2297402"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/ISSCC.2015.7063078"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/TPEL.2013.2284836"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TPEL.2015.2478850"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/ISSCC.2015.7063076"}],"event":{"name":"2018 IEEE International Solid-State Circuits Conference (ISSCC)","start":{"date-parts":[[2018,2,11]]},"location":"San Francisco, CA","end":{"date-parts":[[2018,2,15]]}},"container-title":["2018 IEEE International Solid - State Circuits Conference - (ISSCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8304413\/8310156\/08310372.pdf?arnumber=8310372","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,4,18]],"date-time":"2018-04-18T21:58:08Z","timestamp":1524088688000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8310372\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,2]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/isscc.2018.8310372","relation":{},"subject":[],"published":{"date-parts":[[2018,2]]}}}